Nov. 01, 2008

Enabling 360 degree TEM/STEM of Nanoparticles

A new protocol for functionalizing sample holders has been developed for 360° TEM/STEM observation of nanoparticles and nanostructures. The three step process includes FIB milling to customize sample stub geometry, thin film deposition for substrate selection and subsequent chemical functionalization for nanoparticle adhesion. This protocol was used to determine the morphology and local material properties of individual Au/SiO2 core-shell nanoparticles used in a DNA detection assay.

Nanoscience Imaging & Spectroscopy
moreNov. 01, 2007

360° TEM/STEM Nanoanalysis: Functionalized Holders for 3D Electron Microscopy

360° TEM/STEM Nanoanalysis: Functionalized Holders for 3D Electron Microscopy. A new protocol for functionalizing sample holders has been developed for 360° TEM/STEM observation of nanoparticles and nanostructures. The three step process includes FIB milling to customize sample stub geometry, thin film deposition for substrate selection and subsequent chemical functionalization for nanoparticle adhesion. This protocol was used to determine the morphology and local material properties of individual Au/SiO2 core-shell nanoparticles used in a DNA detection assay. more