Mar. 04, 2011

Nanosurf and Zurich Instruments Announce Partnership

Nanosurf and Zurich Instruments has announced the start of a strategic technology partnership to develop ease of use high-performance scanning probe microscopes:
Nanosurf will propose the Zurich Instruments 50 MHz PLL as upgrade path to its easyPLL and easyPLL plus platform, thereby granting Zurich Instruments immediate access to its large community of PLL users moreNov. 03, 2009

Optical Metrology Made Easy

Surface metrology is quickly emerging as a critical analytical technique to determine the topology of various materials. It can be used to identify corrosion, surface characterization, or to control the quality of different surfaces. Conventional methods such as profilometry, have involved the use of a stylus being dragged along the sample surface. However, this technique can be problematic; it cannot be used on certain materials, such as adhesives, and the dragging process itself may result in inaccurate data being obtained. more