You are here: Home

AFM

AFM Applications in Polymer Science and Engineering
Feb. 01, 2015

AFM Applications in Polymer Science and Engineering

The atomic force microscope (AFM) is a powerful tool for characterizing polymer materials. AFMs can contribute much more information about polymers besides simple topographic morphology, including probing molecular-level forces; mapping mechanical, thermal, and electrical properties; and assessing solvent and thermal effects in near real time. more
GXSM - Smart & Customizable SPM Control
Jan. 26, 2015

GXSM - Smart & Customizable SPM Control

The open source and community driven software project GXSM takes the next level to provide a highly and in-operando adaptable scanning probe microscopy (SPM) control system. A highly efficient digital signal processing (DSP) interfaces any SPM*a to a Linux based PC. Via a Gnome based GUI default scanning but also highly advanced mapping and probing/manipulations can be performed. Standalone it can perform image analysis tasks and multidimensional visualization. more
There is No Other AFM Like a Cypher
Jan. 19, 2015

There is No Other AFM Like a Cypher

Asylum Research Cypher AFMs are in a class of their own. Our scientists and engineers optimized every design choice for the highest resolution, fastest scanning, best environmental control, and exceptional productivity. Cypher routinely achieves higher resolution than other AFMs and is the only fast scanning AFM that supports a full range of modes and accessories. Cypher ES enables hassle-free environmental control - temperature, liquid perfusion, and chemical compatibility. more
Improving Calibration of Atomic Force Microscopes
Dec. 23, 2014

Improving Calibration of Atomic Force Microscopes

Spotting molecule-sized features-common in computer circuits and nanoscale devices-may become both easier and more accurate with a sensor developed at the National Institute of Standards and Technology (NIST). With their new design, NIST scientists may have found a way to sidestep some of the problems in calibrating atomic force microscopes (AFMs).
more
Atomic Force Microscopy: Carving out Nanoscale Designs on Ionic Polymer
Dec. 22, 2014

Atomic Force Microscopy: Carving out Nanoscale Designs on Ionic Polymer

Scientists at the Department of Energy's Oak Ridge National Laboratory have used advanced microscopy to carve out nanoscale designs on the surface of a new class of ionic polymer materials for the first time. The study provides new evidence that atomic force microscopy, or AFM, could be used to precisely fabricate materials needed for increasingly smaller devices.
more
Collagen Surface Functionalization
Dec. 22, 2014

Collagen Surface Functionalization

We tested several sample preparation methods for collagen surfaces, suitable for Single Molecule Force Spectroscopy (SMFS). When collagen was adhered to silicon surfaces or bound via the short EGS-linker, it showed a high adhesive behavior and was therefore not apt for SMFS experiments. In contrast, with a sample preparation procedure using substrates with a dense layer of poly-(ethylene glycol) chains and terminal benzaldehyde functions, unspecific adhesion between tip and sample was low.
more
JPK Announces the Opening of US Offices
Dec. 08, 2014

JPK Announces the Opening of US Offices

JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces the opening of their US offices in Southern California on 1st January, 2015. Heading up this new organization is Dr. Stefan Kaemmer who has been appointed General Manager of US Operations.
more
Scanning Tunnelling Microscopy: Computer Simulations Sharpen Insights Into Molecules
Dec. 02, 2014

Scanning Tunnelling Microscopy: Computer Simulations Sharpen Insights Into Molecules

The resolution of scanning tunnelling microscopes can be improved dramatically by attaching small molecules or atoms to their tip. The resulting images were the first to show the geometric structure of molecules and have generated a lot of interest among scientists over the last few years. Scientists from Forschungszentrum Jülich and the Academy of Sciences of the Czech Republic in Prague have now used computer simulations to gain deeper insights into the physics of these new imaging techniques. One of these techniques was presented in the journal Science by American scientists this spring. The results have now been published in the journal Physical Review Letters. more
Sep. 15, 2014

JPK Expands Availability of Instrumentation in the USA

JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces their expansion into the US market with new distributors and the availability of the NanoWizard AFM.
more
Sep. 02, 2014

TSOM: Optical Microscope Technique Confirmed as Valid 3D Nano-Measurement Tool

TSOM, a technique developed several years ago at the National Institute of Standards and Technology (NIST), can enable optical microscopes to measure the three-dimensional (3-D) shape of objects at nanometer-scale resolution-far below the normal resolution limit for optical microscopy (about 250 nanometers for green light). The results could make the technique a useful quality control tool in the manufacture of nanoscale devices such as next-generation microchips.
more
RSS Newsletter