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New Imaging Technology Could Reveal Cellular Secrets
Apr. 29, 2013

New Imaging Technology Could Reveal Cellular Secrets

Researchers have married two biological imaging technologies, creating a new way to learn how good cells go bad. "Let's say you have a large population of cells," said Corey Neu, an assistant professor in Purdue University's Weldon School of Biomedical Engineering. "Just one of them might metastasize or proliferate, forming a cancerous tumor. We need to understand what it is that gives rise to that one bad cell."
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StrobeLock: A Time-Correlated Single Photon Counting Measurement Option
Mar. 25, 2013

StrobeLock: A Time-Correlated Single Photon Counting Measurement Option

WITec has launched StrobeLock, a time-correlated single photon counting measurement option. The imaging modes include Fluorescence Lifetime Imaging and Time-resolved Luminescence Microscopy, which can be integrated with the alpha300 and alpha500 microscope series.
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Biomolecular Movie-making with High-speed Atomic Force Microscopy
Jan. 24, 2013

Biomolecular Movie-making with High-speed Atomic Force Microscopy

Toshio Ando and co-workers at Kanazawa University have developed and used High-speed Atomic Force Microscopy (HS-AFM) to increase our understanding of several protein systems through microscopic movies of unprecedented spatial and temporal resolution. more
Carbon Nanotubes as Ideal AFM Probes
Dec. 17, 2012

Carbon Nanotubes as Ideal AFM Probes

Carbon nanotubes (CNT) have been demonstrated since 1996 as ideal probes for scanning probe methods because of their nano-size, their cylinder geometry and their mechanical properties. Their use hasn‘t spread out as expected, due to lack of control of their fabrication and of their interaction with surfaces. Sixteen years later, this knowledge is now acquired. Carbon nanotube probes can provide more than high resolution thanks to their high mechanical and chemical stability and surface sensitivity.
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Interdisciplinary Nanoscience Center Uses AFM Force Spectroscopy to Work at the Interface Between Microbiology and Nanoscience
Dec. 12, 2012

Interdisciplinary Nanoscience Center Uses AFM Force Spectroscopy to Work at the Interface Between ...

The group of Dr Rikke Meyer from the interdisciplinary Nanoscience Center (iNANO) at Aarhus University, Denmark has used AFM and single-cell force spectroscopy to work at the interface between microbiology and nanoscience in the quest to understand how bacteria form biofilms and how this may be prevented. more
Bruker Introduces AFM Zoom Option for 3D Optical Microscopes
Nov. 30, 2012

Bruker Introduces AFM Zoom Option for 3D Optical Microscopes

Bruker Nano Surfaces Division has introduced NanoLens Atomic Force Microscope accessory for ContourGT 3D optical microscopes. more
IRIS TERS Probes: Nondestructive and Label-free Chemical Detection at the Nanoscale
Nov. 29, 2012

IRIS TERS Probes: Nondestructive and Label-free Chemical Detection at the Nanoscale

Bruker Nano Surfaces Division has announced the release of IRIS TERS Probes. By enabling Tip- Enhanced Raman Spectroscopy (TERS), the IRIS TERS Probes provide users a complete path to nondestructive, label-free chemical detection at the nanoscale. more
Nov. 29, 2012

WITec Extends Distribution in Israel

WITec and Advanced Technological Solutions Ltd. (ATSL) have announced that they have entered into a new distribution agreement that will enable WITec to extend its global reach and promote its full product line of high-resolution SNOM, AFM and Raman Imaging solutions in Israel.
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Fast Bio-AFM Scan with High Resolution
Oct. 16, 2012

Fast Bio-AFM Scan with High Resolution

The Dimension FastScan Bio AFM from Bruker Nano Surfaces Division delivers fast scanning rates without loss of resolution or force control.

The system delivers the scanning speed required for high-resolution spatiotemporal studies. The fast scanning allows temporal investigation under physiological operating environments in fluid while exceeding the diffraction limits of optical microscopy. more
Analysing Nanoscale Materials with Near-field Scanning Microwave Microscopy
Oct. 02, 2012

Analysing Nanoscale Materials with Near-field Scanning Microwave Microscopy

With a new near-field scanning microwave microscope (NSMM) researchers from the National Institute of Standards and Technology (NIST) will improve the ability to determine the composition and physics of nanoscale materials and devices dramatically.

Few techniques can make measurements of equivalent resolution for such a wide range of samples, including semiconductors, semiconducting nanowire, materials for photovoltaic applications, magnetic materials, multiferroic materials, and even proteins and DNA. more
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