Dec. 01, 2017News
A team of scientists working at the University of Bristol have developed a new nanomapping microscope - powered by the laser and optics found in a typical DVD player. The new technology is being used to transform the way disease-causing ...
Nov. 22, 2017Products
Park NX20 300mm enables AFM inspection and scans over the entire sample area of 300mm wafers by using a full 300mm x 300mm motorized XY stage so the system can access any location on a 300mm wafer.
Nov. 20, 2017Science
Hydrophobins are fungal proteins with many potential applications due to their ability to self-assemble into amphipathic films at hydrophobic:hydrophillic interfaces. The ability to manipulate surface characteristics of hydrophobin films ...
Nov. 07, 2017News
Park Systems, a provider of Atomic Force Microscopes (AFM), announces the opening of the Park NanoScience Center at the State University of New York Polytechnic Institute (SUNY Poly), one of the world’s most advanced high-tech ...
Nov. 02, 2017Products
The leading scientific equipment manufacturing company Anton Paar is announcing the launch of Tosca analysis software, based on Digital Surf’s Mountains surface analysis technology.
Oct. 06, 2017News
Oak Ridge National Laboratory scientists have developed a technique for making ultrafast measurements using atomic force microscopy, which previously could only investigate slow or static material structures and functions.
Sep. 28, 2017News
Tufts researchers have discovered a new, faster way to image materials at the nano level, an advance that could speed the detection of cancer and assist in the development of new high-tech materials. The new method was discovered by Igor ...
Jun. 21, 2017Products
Park Systems, world-leading manufacturer of Atomic Force Microscopes (AFM) just announced new Park NX12, an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities.
Jun. 19, 2017Science
We offer a simple explanation of the effect of the higher eigenmode’s free amplitude on probe sensitivity and indentation depth in bimodal atomic force microscopy (AFM). The explanation is based on a qualitative analysis of the ...
Jun. 13, 2017News
Using two novel techniques, researchers at the National Institute of Standards and Technology (NIST) have for the first time examined, with nanometer-scale precision, the variations in chemical composition and defects of widely used solar ...
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