Apr. 29, 2013
Researchers have married two biological imaging technologies, creating a new way to learn how good cells go bad. "Let's say you have a large population of cells," said Corey Neu, an assistant professor in Purdue University's Weldon School of Biomedical Engineering. "Just one of them might metastasize or proliferate, forming a cancerous tumor. We need to understand what it is that gives rise to that one bad cell."
moreMar. 25, 2013
WITec has launched StrobeLock, a time-correlated single photon counting measurement option. The imaging modes include Fluorescence Lifetime Imaging and Time-resolved Luminescence Microscopy, which can be integrated with the alpha300 and alpha500 microscope series.
moreJan. 24, 2013
Toshio Ando and co-workers at Kanazawa University have developed and used High-speed Atomic Force Microscopy (HS-AFM) to increase our understanding of several protein systems through microscopic movies of unprecedented spatial and temporal resolution.
moreDec. 17, 2012
Carbon nanotubes (CNT) have been demonstrated since 1996 as ideal probes for scanning probe methods because of their nano-size, their cylinder geometry and their mechanical properties. Their use hasn‘t spread out as expected, due to lack of control of their fabrication and of their interaction with surfaces. Sixteen years later, this knowledge is now acquired. Carbon nanotube probes can provide more than high resolution thanks to their high mechanical and chemical stability and surface sensitivity.
moreDec. 12, 2012
The group of Dr Rikke Meyer from the interdisciplinary Nanoscience Center (iNANO) at Aarhus University, Denmark has used AFM and single-cell force spectroscopy to work at the interface between microbiology and nanoscience in the quest to understand how bacteria form biofilms and how this may be prevented.
moreNov. 30, 2012
Bruker Nano Surfaces Division has introduced NanoLens Atomic Force Microscope accessory for ContourGT 3D optical microscopes.
moreNov. 29, 2012
Bruker Nano Surfaces Division has announced the release of IRIS TERS Probes. By enabling Tip- Enhanced Raman Spectroscopy (TERS), the IRIS TERS Probes provide users a complete path to nondestructive, label-free chemical detection at the nanoscale.
moreNov. 29, 2012
WITec and Advanced Technological Solutions Ltd. (ATSL) have announced that they have entered into a new distribution agreement that will enable WITec to extend its global reach and promote its full product line of high-resolution SNOM, AFM and Raman Imaging solutions in Israel.
moreOct. 16, 2012
The Dimension FastScan Bio AFM from Bruker Nano Surfaces Division delivers fast scanning rates without loss of resolution or force control.
The system delivers the scanning speed required for high-resolution spatiotemporal studies. The fast scanning allows temporal investigation under physiological operating environments in fluid while exceeding the diffraction limits of optical microscopy.
moreOct. 02, 2012
With a new near-field scanning microwave microscope (NSMM) researchers from the National Institute of Standards and Technology (NIST) will improve the ability to determine the composition and physics of nanoscale materials and devices dramatically.
Few techniques can make measurements of equivalent resolution for such a wide range of samples, including semiconductors, semiconducting nanowire, materials for photovoltaic applications, magnetic materials, multiferroic materials, and even proteins and DNA.