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Combining Atomic Force Microscopy with Mass Spectrometry in one Instrument
May. 04, 2015

Combining Atomic Force Microscopy with Mass Spectrometry in one Instrument

The probe of an atomic force microscope (AFM) scans a surface to reveal details at a resolution 1,000 times greater than that of an optical microscope. That makes AFM the premier tool for analyzing physical features, but it cannot tell scientists anything about chemistry. For that they turn to the mass spectrometer (MS).
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TEM of Sensitive Organic Materials
Apr. 24, 2015

TEM of Sensitive Organic Materials

In this article the adaption of a scanning-nanobeam diffraction technique for the transmission electron microscope (ASTAR system) to beam-sensitive organic materials will be discussed. This method not only offers additional functionality for the nanoscale characterization of organic films but is inherently advantageous for materials that are prone to beam-induced structural changes. As example of co-deposited films of pentacene (PEN) and perfluoropentacene (PFP) grown on KCl(100) were used.
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New Atomic Force Microscopy System Optimized for Live-Cell Imaging
Mar. 19, 2015

New Atomic Force Microscopy System Optimized for Live-Cell Imaging

Researchers at the Max Planck Florida Institute for Neuroscience and Kanazawa University (Japan) have succeeded in imaging structural dynamics of living neurons with an unprecedented spatial resolution. They have built a new Atomic Force Microscopy system optimized for live-cell imaging. The results have been published in the journal Scientific Reports.
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Subsurface Imaging of Soft Matter by AFM
Mar. 16, 2015

Subsurface Imaging of Soft Matter by AFM

In recent years, a variety of dynamic force microscopy techniques have been developed to obtain surface compositional contrast and extract material properties simultaneously with topographical imaging. We describe here one such recent method, trimodal atomic force microscopy (trimodal AFM), which allows topographical imaging, compositional mapping and control of the tip-sample indentation during a single-pass 2-dimensional (2D) scan.
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AFM Applications in Polymer Science and Engineering
Feb. 01, 2015

AFM Applications in Polymer Science and Engineering

The atomic force microscope (AFM) is a powerful tool for characterizing polymer materials. AFMs can contribute much more information about polymers besides simple topographic morphology, including probing molecular-level forces; mapping mechanical, thermal, and electrical properties; and assessing solvent and thermal effects in near real time. more
GXSM - Smart & Customizable SPM Control
Jan. 26, 2015

GXSM - Smart & Customizable SPM Control

The open source and community driven software project GXSM takes the next level to provide a highly and in-operando adaptable scanning probe microscopy (SPM) control system. A highly efficient digital signal processing (DSP) interfaces any SPM*a to a Linux based PC. Via a Gnome based GUI default scanning but also highly advanced mapping and probing/manipulations can be performed. Standalone it can perform image analysis tasks and multidimensional visualization. more
There is No Other AFM Like a Cypher
Jan. 19, 2015

There is No Other AFM Like a Cypher

Asylum Research Cypher AFMs are in a class of their own. Our scientists and engineers optimized every design choice for the highest resolution, fastest scanning, best environmental control, and exceptional productivity. Cypher routinely achieves higher resolution than other AFMs and is the only fast scanning AFM that supports a full range of modes and accessories. Cypher ES enables hassle-free environmental control - temperature, liquid perfusion, and chemical compatibility. more
Improving Calibration of Atomic Force Microscopes
Dec. 23, 2014

Improving Calibration of Atomic Force Microscopes

Spotting molecule-sized features-common in computer circuits and nanoscale devices-may become both easier and more accurate with a sensor developed at the National Institute of Standards and Technology (NIST). With their new design, NIST scientists may have found a way to sidestep some of the problems in calibrating atomic force microscopes (AFMs).
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Atomic Force Microscopy: Carving out Nanoscale Designs on Ionic Polymer
Dec. 22, 2014

Atomic Force Microscopy: Carving out Nanoscale Designs on Ionic Polymer

Scientists at the Department of Energy's Oak Ridge National Laboratory have used advanced microscopy to carve out nanoscale designs on the surface of a new class of ionic polymer materials for the first time. The study provides new evidence that atomic force microscopy, or AFM, could be used to precisely fabricate materials needed for increasingly smaller devices.
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Collagen Surface Functionalization
Dec. 22, 2014

Collagen Surface Functionalization

We tested several sample preparation methods for collagen surfaces, suitable for Single Molecule Force Spectroscopy (SMFS). When collagen was adhered to silicon surfaces or bound via the short EGS-linker, it showed a high adhesive behavior and was therefore not apt for SMFS experiments. In contrast, with a sample preparation procedure using substrates with a dense layer of poly-(ethylene glycol) chains and terminal benzaldehyde functions, unspecific adhesion between tip and sample was low.
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