Aug. 25, 2014
Laser physicists have found a way to make atomic-force microscope probes 20 times more sensitive and capable of detecting forces as small as the weight of an individual virus.
The technique, developed by researchers at The Australian National University (ANU), hinges on using laser beams to cool a nanowire probe to minus 265 degrees Celsius.
moreAug. 14, 2014
In this study APTMS and APREMS aminosilanes were used for the modification of silicon, with a purpose for using them in sensor´s applications (detection of explosives like TNT, DNT, RDX, etc.). The morphology and surface chemistry of the modified surfaces were investigated using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). Our results show that the polymerization of aminosilanes and consequently the thickness of the aminosilane layer depend on the number of possible bonding sites of the aminosilane molecule.
moreJul. 24, 2014
Polarization charges in ferroelectric materials are screened by equal amounts of surface charges with opposite polarity under ambient conditions. Researchers from the Center for Nanoscale Materials, Argonne's Nanoscience & Technology and Materials Science divisions, and Tohoku University have shown that scraping, collecting, and quantifying surface screen charges reveals the underlying polarization domain structure at high speed, a technique dubbed charge gradient microscopy (CGM).
moreJul. 17, 2014
Large area ordered nanopatterning of RF sputtered AlOx layers have been carried out. The technique involves UV laser treating of the film through LB films of silica nanospheres. The hexagonal, close packed arrangement of these spheres was projected to the surface due to the laser treatment resulting in ordered structure of pits of ~200 nm diameter and 1.3 nm depths. The samples were characterized by means of AFM and XTEM. Experimental results are in good agreement with the simulations.
moreJun. 16, 2014
Coupled three-dimensional Ge quantum dot crystals (QDCs) are realized by multilayer growth of quantum dots (QDs) on patterned Si (001) substrates. With increasing the vertical periodic number of the QDCs, the photoluminescence (PL) spectral linewidth decreased exponentially, and so did the peak energy blueshift caused by increasing excitation power, which are attributed to the electronic coupling and thus the formation of miniband.
moreJun. 10, 2014
The WITec Suite software is specifically developed to acquire and process large data volumes of large-area, high-resolution measurements and 3D imaging while providing speed, performance, and usability.
Through the software architecture and graphical user interface an integrated and consolidated functionality is available incorporating the various techniques and measurement modes from Raman, to AFM, to SNOM, fluorescence and luminescence.
moreMay. 27, 2014
In response to requests from the semiconductor industry, a team of PML researchers has demonstrated that atomic force microscope (AFM) probe tips made from its near-perfect gallium nitride nanowires are superior in many respects to standard silicon or platinum tips in measurements of critical importance to microchip fabrication, nanobiotechnology, and other endeavors.
moreMay. 15, 2014
For years, scientists have had an itch they couldn't scratch. Even with the best microscopes and spectrometers, it's been difficult to study and identify molecules at the so-called mesoscale, a region of matter that ranges from 10 to 1000 nanometers in size. Now, with the help of broadband infrared light from the Advanced Light Source (ALS) synchrotron at the U.S. Department of Energy's Lawrence Berkeley National Laboratory (Berkeley Lab), researchers have developed a broadband imaging technique (Synchrotron Infrared Nano-Spectroscopy) that looks inside this realm with unprecedented sensitivity and range. The results have been published in PNAS.
moreMay. 08, 2014
Oxford Instruments Asylum Research's MFP-3D Infinity AFM features a large 90 µm stage and entirely new control electronics that are located close to the AFM for fast, low noise performance. Flexible signal switching and programmable logic enable future expansion options.
moreApr. 14, 2014
Atomic force microscopy (AFM) has become a promising tool for manipulating nano-objects to fabricate nano-structures or nano-devices. However, there are still some challenges facing the development of an AFM based robotic nanomanipulation system, such as the uncertainties associated with AFM tip and nanoparticles, the single point force and interaction between the tip and nanoparticles, and the parameter calibration of models being used. This work was published in IEEE Nanotechnology Magazine.