Feb. 01, 2015
The atomic force microscope (AFM) is a powerful tool for characterizing polymer materials. AFMs can contribute much more information about polymers besides simple topographic morphology, including probing molecular-level forces; mapping mechanical, thermal, and electrical properties; and assessing solvent and thermal effects in near real time.
moreJan. 26, 2015
The open source and community driven software project GXSM takes the next level to provide a highly and in-operando adaptable scanning probe microscopy (SPM) control system. A highly efficient digital signal processing (DSP) interfaces any SPM*a to a Linux based PC. Via a Gnome based GUI default scanning but also highly advanced mapping and probing/manipulations can be performed. Standalone it can perform image analysis tasks and multidimensional visualization.
moreJan. 19, 2015
Asylum Research Cypher AFMs are in a class of their own. Our scientists and engineers optimized every design choice for the highest resolution, fastest scanning, best environmental control, and exceptional productivity. Cypher routinely achieves higher resolution than other AFMs and is the only fast scanning AFM that supports a full range of modes and accessories. Cypher ES enables hassle-free environmental control - temperature, liquid perfusion, and chemical compatibility.
moreDec. 23, 2014
Spotting molecule-sized features-common in computer circuits and nanoscale devices-may become both easier and more accurate with a sensor developed at the National Institute of Standards and Technology (NIST). With their new design, NIST scientists may have found a way to sidestep some of the problems in calibrating atomic force microscopes (AFMs).
moreDec. 22, 2014
Scientists at the Department of Energy's Oak Ridge National Laboratory have used advanced microscopy to carve out nanoscale designs on the surface of a new class of ionic polymer materials for the first time. The study provides new evidence that atomic force microscopy, or AFM, could be used to precisely fabricate materials needed for increasingly smaller devices.
moreDec. 22, 2014
We tested several sample preparation methods for collagen surfaces, suitable for Single Molecule Force Spectroscopy (SMFS). When collagen was adhered to silicon surfaces or bound via the short EGS-linker, it showed a high adhesive behavior and was therefore not apt for SMFS experiments. In contrast, with a sample preparation procedure using substrates with a dense layer of poly-(ethylene glycol) chains and terminal benzaldehyde functions, unspecific adhesion between tip and sample was low.
moreDec. 08, 2014
JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces the opening of their US offices in Southern California on 1st January, 2015. Heading up this new organization is Dr. Stefan Kaemmer who has been appointed General Manager of US Operations.
moreDec. 02, 2014
The resolution of scanning tunnelling microscopes can be improved dramatically by attaching small molecules or atoms to their tip. The resulting images were the first to show the geometric structure of molecules and have generated a lot of interest among scientists over the last few years. Scientists from Forschungszentrum Jülich and the Academy of Sciences of the Czech Republic in Prague have now used computer simulations to gain deeper insights into the physics of these new imaging techniques. One of these techniques was presented in the journal Science by American scientists this spring. The results have now been published in the journal Physical Review Letters.
moreSep. 15, 2014
JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces their expansion into the US market with new distributors and the availability of the NanoWizard AFM.
moreSep. 02, 2014
TSOM, a technique developed several years ago at the National Institute of Standards and Technology (NIST), can enable optical microscopes to measure the three-dimensional (3-D) shape of objects at nanometer-scale resolution-far below the normal resolution limit for optical microscopy (about 250 nanometers for green light). The results could make the technique a useful quality control tool in the manufacture of nanoscale devices such as next-generation microchips.