You are here: Home

AFM Cantilever

Atomic Force Microscopy: Short, Flexible, Reusable AFM Probe
Apr. 11, 2014

Atomic Force Microscopy: Short, Flexible, Reusable AFM Probe

An AFM probe is a cantilever, shaped like a tiny diving board with a small, atomic-scale point on the free end. To measure forces at the molecular scale in a liquid, the probe attaches its tip to a molecule such as a protein and pulls; the resulting deflection of the cantilever is measured. The forces are in the realm of piconewtons, or trillionths of a newton. One newton is roughly the weight of a small apple. The new probe design, described in ACS Nano, is the JILA research group's third recent advance in AFM technology. more
AFM-IR: Nanoscale Chemical Analysis with Unprecedented Sensitivity
Feb. 06, 2014

AFM-IR: Nanoscale Chemical Analysis with Unprecedented Sensitivity

Researchers in the Department of Electrical and Computer Engineering at The University of Texas at Austin (UT ECE) have demonstrated the ability to perform nanoscale chemical analysis of molecular films with unprecedented sensitivity by detecting molecular photoexpansion. PhD students Feng Lu and Mingzhou Jin led by Prof. Mikhail Belkin successfully acquired high-quality infrared spectra from as few as 300 molecules in ambient conditions and achieved better than 25 nm spatial resolution. These capabilities enable a highly-sensitive nanoscale analytical tool for chemists, biologists and materials scientists. The results were published in Nature Photonics.
more
Microscopic Fountain Pen: Adding New Functionality to an AFM Microscope
Jan. 16, 2014

Microscopic Fountain Pen: Adding New Functionality to an AFM Microscope

The Atomic Force Microscope (AFM), which uses a fine-tipped probe to scan surfaces at the atomic scale, will soon be augmented with a chemical sensor. This involves the use of a hollow AFM cantilever, through which a liquid - in this case mercury - is passed under pressure. The droplet of mercury at the tip acts as a sensor. This microscopic fountain pen was developed by researchers at the University of Twente's MESA+ Institute for Nanotechnology. Details of the "fountain pen's" mechanism of action were recently published in Analytical Chemistry.
more
New Imaging Technology Could Reveal Cellular Secrets
Apr. 29, 2013

New Imaging Technology Could Reveal Cellular Secrets

Researchers have married two biological imaging technologies, creating a new way to learn how good cells go bad. "Let's say you have a large population of cells," said Corey Neu, an assistant professor in Purdue University's Weldon School of Biomedical Engineering. "Just one of them might metastasize or proliferate, forming a cancerous tumor. We need to understand what it is that gives rise to that one bad cell."
more
Trolling AFM: Imaging of Soft Cells and Tissues at Atomic Resolution
Jun. 18, 2012

Trolling AFM: Imaging of Soft Cells and Tissues at Atomic Resolution

University of Illinois researchers developed a method they call "trolling AFM," which allows them to study soft biological samples in liquid with high resolution and high quality. more
Tip Mass Effects on Image Contrast
Dec. 05, 2011

Tip Mass Effects on Image Contrast

When an oscillating AFM cantilever approaches a sample, the tip-sample interaction force influences the cantilever dynamics. The magnitude of the contact interaction force depends on the stiffness of the materials. Stiffness of the material affects sensitivity of different modes differently. This sensitivity controls the image contrast. Here, the effect of tip mass on the modal flexural sensitivity of AFM cantilever to the variations of surface stiffness and image contrast is investigated.
more
Website for High Speed Scanning Atomic Force Microscopy
May. 31, 2011

Website for High Speed Scanning Atomic Force Microscopy

NanoWorld has introduced a website entirely dedicated to High Speed Scanning Atomic Force Microscopy (HS-AFM). more
Tensile Testing of Microstructures
May. 13, 2011

Tensile Testing of Microstructures

The small size of micro- and nano-structures makes tensile testing challenging. In this study we meet this challenge by combined use of a Focussed Ion Beam (FIB) in Dual Beam configuration, an AFM-cantilever, and a micromanipulator which provide the required accuracy and versatility to measure the mechanical properties of nanowires by tensile testing. AFM cantilevers with a big range of force constants principally enable us to measure the tensile behavior of a great variety of materials. more
RSS Newsletter