Feb. 02, 2011

EDAX Introduces Apollo Silicon Drift Detector Series for TEM

EDAX released the Apollo Silicon Drift Detector (SDD) Series for the transmission electron microscope (TEM). The series includes the Apollo XLT with a Super Ultra Thin Window (SUTW) and the Apollo XLTW, a windowless version. The windowless version further maximizes the collection efficiency and improves sensitivity up to 500% for low-energy X-rays. As a result, the mapping speed and light element detection in low concentrations are enhanced with the Apollo XLTW. moreDec. 23, 2009

Apollo SDD Series for EDS Analysis

EDAX has introduced the next series of Apollo SDD detectors for X-ray microanalysis. "While the Apollo Series offers a range of detector sizes and performance levels including a large-area SDD chip," notes Judy O'Loughlin, Director of Product Marketing for EDAX, "it emphasizes a more important feature, the positioning of the detectors close to the sample, making it comparable to the best-designed Si(Li) detectors. EDAX's Apollo Series offers users the best of both worlds. All SDDs are able to map at high resolution, and all SDDs can map at high count rates. more