Dec. 17, 2012

Oxford Instruments Acquires Asylum Research

Asylum Research, a provider of in scanning probe/atomic force microscopes, announces that it has been acquired by Oxford Instruments, a  provider of high technology tools and systems for industry and research. The acquisition is subject to customary conditions of the London Stock Exchange and is expected to be completed before the end of December 2012.
moreJun. 01, 2012

Five-Year Warranty on Instruments from Asylum Research

With a five-year warranty on all its Atomic Force/Scanning Probe Microscopes, Asylum Research sets a higher standard in customer support.
The warranty covers parts and labor on Asylum's Cypher, MFP-3D Atomic Force Microscopes and MFP NanoIndenters.  In the unlikely event of a breakdown during normal usage, Asylum will repair the system, or replace the broken part, at zero cost to the user.
www.asylumresearch.com
  moreNov. 03, 2011

Variable Field Module for Magnetic Atomic Force Microscopy Experiments

Asylum Research has launched the Variable Field Module2 (VFM2) for magnetic atomic force microscopy applications with MFP-3D Atomic Force Microscopes (AFM). moreMar. 17, 2011

Asylum Research Launches Scanning Probe Microscopy Technique for Mapping Electrochemical Phenomena ...

Asylum Research has introduced the Electrochemical Strain Microscopy (ESM) imaging technique for mapping electrochemical phenomena on the nanoscale: moreMar. 11, 2011

Asylum Research Launches Tool for Electrochemical Experiments Coupled with AFM

Asylum Research has introduced an Electrochemistry Cell (EC Cell) for electrochemical experiments combined with AFM imaging: moreJan. 21, 2011

Asylum Research Sets Annual Sales Record

Asylum Research sales set a new record for 2010. The 2010 results exceeded Asylum's record-breaking 2009 by nearly 20%. moreNov. 08, 2010

Measurements of Adhesive Strength, Deformations and Cracking

Asylum Research has announced the new NanoRack Sample Stretching Stage Accessory for its MFP-3D AFMs. This high-strain, high-travel manual stretching stage provides two axis stress control of tensile loaded samples under different loads. Automatic load cell calibration provides integrated force measurements with MFP-3D images or other measurements, and returns both stress and strain data. moreJun. 25, 2010

AFM and Combined Optical Techniques

This article briefly describes the basics of both optical and atomic force microscopy, followed by a discussion of some of the technical challenges of integrating these two distinct imaging modalities. In certain cases, the benefits and disadvantages of different approaches to design and integration are discussed. Lastly, a few examples of successful application of these combined imaging modalities are presented.

Introduction
moreJun. 14, 2010

OnLine AFM/SPM Probe Store

Asylum Research announces that its new automated AFM/SPM Probe Store is now online. The probe store provides simple search, sort, selection, quotation and purchase for a wide variety of different probes. moreFeb. 23, 2010

Asylum Research Extends Distribution in Latin America

Asylum Research and Micra Nanotecnologia announced that they have entered into a new distribution agreement that will enable Asylum to extend its global reach and promote its products in Latin America. Based in Mexico City, Micra Nanotecnologia, is the most experienced microscopy distributor in Latin America, with over two decades specializing in providing atomic force microscopes and other microscopy instrumentation. They will sell, install, and support Asylum's complete line of scanning probe/atomic force microscopes, including the Cypher AFM and the MFP-3D Family of AFMs. more