Apr. 29, 2013

New Imaging Technology Could Reveal Cellular Secrets

Researchers have married two biological imaging technologies, creating a new way to learn how good cells go bad. "Let's say you have a large population of cells," said Corey Neu, an assistant professor in Purdue University's Weldon School of Biomedical Engineering. "Just one of them might metastasize or proliferate, forming a cancerous tumor. We need to understand what it is that gives rise to that one bad cell."
moreOct. 16, 2012

Fast Bio-AFM Scan with High Resolution

The Dimension FastScan Bio AFM from Bruker Nano Surfaces Division delivers fast scanning rates without loss of resolution or force control.

The system delivers the scanning speed required for high-resolution spatiotemporal studies. The fast scanning allows temporal investigation under physiological operating environments in fluid while exceeding the diffraction limits of optical microscopy. moreOct. 02, 2012

Analysing Nanoscale Materials with Near-field Scanning Microwave Microscopy

With a new near-field scanning microwave microscope (NSMM) researchers from the National Institute of Standards and Technology (NIST) will improve the ability to determine the composition and physics of nanoscale materials and devices dramatically.

Few techniques can make measurements of equivalent resolution for such a wide range of samples, including semiconductors, semiconducting nanowire, materials for photovoltaic applications, magnetic materials, multiferroic materials, and even proteins and DNA. moreSep. 17, 2012

Atomic Force Microscopy Helps Scientists to Distinguish Individual Molecular Bonds

IBM scientists have been able to differentiate the chemical bonds in individual molecules for the first time using a technique known as non-contact atomic force microscopy (AFM). The results push the exploration of using molecules and atoms at the smallest scale and could be important for studying graphene devices, which are currently being explored by both industry and academia for applications including high-bandwidth wireless communication and electronic displays.
moreJun. 01, 2012

Five-Year Warranty on Instruments from Asylum Research

With a five-year warranty on all its Atomic Force/Scanning Probe Microscopes, Asylum Research sets a higher standard in customer support.
The warranty covers parts and labor on Asylum's Cypher, MFP-3D Atomic Force Microscopes and MFP NanoIndenters.  In the unlikely event of a breakdown during normal usage, Asylum will repair the system, or replace the broken part, at zero cost to the user.
www.asylumresearch.com
  moreDec. 05, 2011

Tip Mass Effects on Image Contrast

When an oscillating AFM cantilever approaches a sample, the tip-sample interaction force influences the cantilever dynamics. The magnitude of the contact interaction force depends on the stiffness of the materials. Stiffness of the material affects sensitivity of different modes differently. This sensitivity controls the image contrast. Here, the effect of tip mass on the modal flexural sensitivity of AFM cantilever to the variations of surface stiffness and image contrast is investigated.
moreSep. 15, 2011

Bruker to Acquire CETR

Bruker announced the signing of a purchase agreement to acquire Center for Tribology (CETR) for an undisclosed amount. CETR, a privately held corporation located in Silicon Valley in Campbell, CA, is projected to have calendar year 2011 revenue greater than US-$ 10 million and EBITDA greater than US-$ 2 million. The transaction is expected to close at the end of the third quarter of 2011, subject to customary closing conditions. moreAug. 01, 2011

Laser-Guided Atomic Force Microscopy

Application of Atomic Force Microscopy (AFM) to a broad range of research, and biological systems in particular, is hampered by two longstanding technical problems: mechanical drift and finding sparsely distributed samples. By adapting ideas from the optical-trapping community, we have made significant progress in addressing both of these issues, including a 100-fold improvement in the stability of AFM at ambient conditions. moreMar. 28, 2011

NanoWizard 3 NanoScience System from JPK: AFM Performance in Liquids and Air, Integrated with ...

JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, continues to expand its family of high performance research systems with the announcement of the availability of the NanoWizard 3 NanoScience AFM system.
moreDec. 21, 2010

Towards Automated AFM-based Nanohandling of DNA, SAMs and CNTs

Besides its ability of high resolution imaging, the Atomic Force Microscope (AFM) has been recognized as a valuable instrument for manipulation at the nanoscale. The characterization and manipulation of Carbon Nanotubes (CNTs) and DNA or the prototypical surface structuring of sensitive elements for biosensors are main applications for AFM-based nanohandling. The relatively low throughput induced by the sequential character of the AFM is one of the major drawbacks that arise, if the AFM is used as a robot for nanomanipulation. more