May. 04, 2015
The probe of an atomic force microscope (AFM) scans a surface to reveal details at a resolution 1,000 times greater than that of an optical microscope. That makes AFM the premier tool for analyzing physical features, but it cannot tell scientists anything about chemistry. For that they turn to the mass spectrometer (MS).
moreDec. 23, 2014
Spotting molecule-sized features-common in computer circuits and nanoscale devices-may become both easier and more accurate with a sensor developed at the National Institute of Standards and Technology (NIST). With their new design, NIST scientists may have found a way to sidestep some of the problems in calibrating atomic force microscopes (AFMs).
moreSep. 15, 2014
JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announces their expansion into the US market with new distributors and the availability of the NanoWizard AFM.
moreMay. 27, 2014
In response to requests from the semiconductor industry, a team of PML researchers has demonstrated that atomic force microscope (AFM) probe tips made from its near-perfect gallium nitride nanowires are superior in many respects to standard silicon or platinum tips in measurements of critical importance to microchip fabrication, nanobiotechnology, and other endeavors.
moreMar. 19, 2014
Even the mildest form of a traumatic brain injury, better known as a concussion, can deal permanent, irreparable damage. Now, an interdisciplinary team of researchers at the University of Pennsylvania is using mathematical modeling to better understand the mechanisms at play in this kind of injury, with an eye toward protecting the brain from its long-term consequences.
moreMar. 10, 2014
In collaboration with colleagues from Berlin and Madrid, researchers at the Department of Physics at the University of Basel have pulled up isolated molecular chains from a gold surface, using the tip of an atomic force microscope (AFM). The observed signal provides insight into the detachment force and binding energy of molecules. The results have been published in the journal PNAS.
moreJan. 20, 2014
The GetReal Automated Probe Calibration feature from Asylum Research enables the user with just one click to fully calibrate the atomic force microscope (AFM) probe sensitivity and spring constant, enabling more consistent, more accurate results.
It also protects the probe from damage that often occurs with conventional calibration methods.
The feature is included at no extra charge exclusively with Asylum Research MFP-3D and Cypher family AFMs.
moreJan. 16, 2014
The Atomic Force Microscope (AFM), which uses a fine-tipped probe to scan surfaces at the atomic scale, will soon be augmented with a chemical sensor. This involves the use of a hollow AFM cantilever, through which a liquid - in this case mercury - is passed under pressure. The droplet of mercury at the tip acts as a sensor. This microscopic fountain pen was developed by researchers at the University of Twente's MESA+ Institute for Nanotechnology. Details of the "fountain pen's" mechanism of action were recently published in Analytical Chemistry.
moreJan. 02, 2014
Membrane proteins are the "gatekeepers" that allow information and molecules to pass into and out of a cell. Until recently, the microscopic study of these complex proteins has been restricted due to limitations of "atomic force microscopes" that are available to researchers and the one-dimensional results these microscopes reveal. Now, researchers at the University of Missouri have developed a three-dimensional microscope that will yield unparalleled study of membrane proteins and how they interact on the cellular level. These microscopes could help pharmaceutical companies bring drugs to market faster.
moreDec. 19, 2013
In collaboration with the University of Basel, an international team of researchers has observed a strong energy loss caused by frictional effects in the vicinity of charge density waves. The researchers vibrated the nanometer-sized tip of an atomic force microscope above the surface of a layered structure of niobium and selenium atoms. This may have practical significance in the control of nanoscale friction. The results have been published in the scientific journal Nature Materials.