Feb. 01, 2015
The atomic force microscope (AFM) is a powerful tool for characterizing polymer materials. AFMs can contribute much more information about polymers besides simple topographic morphology, including probing molecular-level forces; mapping mechanical, thermal, and electrical properties; and assessing solvent and thermal effects in near real time.
moreJan. 19, 2015
Asylum Research Cypher AFMs are in a class of their own. Our scientists and engineers optimized every design choice for the highest resolution, fastest scanning, best environmental control, and exceptional productivity. Cypher routinely achieves higher resolution than other AFMs and is the only fast scanning AFM that supports a full range of modes and accessories. Cypher ES enables hassle-free environmental control - temperature, liquid perfusion, and chemical compatibility.
moreDec. 23, 2014
Spotting molecule-sized features-common in computer circuits and nanoscale devices-may become both easier and more accurate with a sensor developed at the National Institute of Standards and Technology (NIST). With their new design, NIST scientists may have found a way to sidestep some of the problems in calibrating atomic force microscopes (AFMs).
moreDec. 22, 2014
Scientists at the Department of Energy's Oak Ridge National Laboratory have used advanced microscopy to carve out nanoscale designs on the surface of a new class of ionic polymer materials for the first time. The study provides new evidence that atomic force microscopy, or AFM, could be used to precisely fabricate materials needed for increasingly smaller devices.
moreDec. 22, 2014
We tested several sample preparation methods for collagen surfaces, suitable for Single Molecule Force Spectroscopy (SMFS). When collagen was adhered to silicon surfaces or bound via the short EGS-linker, it showed a high adhesive behavior and was therefore not apt for SMFS experiments. In contrast, with a sample preparation procedure using substrates with a dense layer of poly-(ethylene glycol) chains and terminal benzaldehyde functions, unspecific adhesion between tip and sample was low.
moreDec. 02, 2014
The resolution of scanning tunnelling microscopes can be improved dramatically by attaching small molecules or atoms to their tip. The resulting images were the first to show the geometric structure of molecules and have generated a lot of interest among scientists over the last few years. Scientists from Forschungszentrum Jülich and the Academy of Sciences of the Czech Republic in Prague have now used computer simulations to gain deeper insights into the physics of these new imaging techniques. One of these techniques was presented in the journal Science by American scientists this spring. The results have now been published in the journal Physical Review Letters.
moreSep. 16, 2014
Oxford Instruments Asylum Research has received the 2014 Microscopy Today Innovation Award for the development of blueDrive Photothermal Excitation. blueDrive, an option available exclusively for Asylum's Cypher Atomic Force Microscopes (AFMs), makes tapping mode imaging remarkably simple, incredibly stable, and strikingly accurate. It replaces the conventional piezoacoustic excitation mechanism of the AFM cantilever by using a blue laser to directly excite the cantilever photothermally.
moreAug. 25, 2014
Laser physicists have found a way to make atomic-force microscope probes 20 times more sensitive and capable of detecting forces as small as the weight of an individual virus.
The technique, developed by researchers at The Australian National University (ANU), hinges on using laser beams to cool a nanowire probe to minus 265 degrees Celsius.
moreAug. 14, 2014
In this study APTMS and APREMS aminosilanes were used for the modification of silicon, with a purpose for using them in sensor´s applications (detection of explosives like TNT, DNT, RDX, etc.). The morphology and surface chemistry of the modified surfaces were investigated using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). Our results show that the polymerization of aminosilanes and consequently the thickness of the aminosilane layer depend on the number of possible bonding sites of the aminosilane molecule.
moreJul. 24, 2014
Polarization charges in ferroelectric materials are screened by equal amounts of surface charges with opposite polarity under ambient conditions. Researchers from the Center for Nanoscale Materials, Argonne's Nanoscience & Technology and Materials Science divisions, and Tohoku University have shown that scraping, collecting, and quantifying surface screen charges reveals the underlying polarization domain structure at high speed, a technique dubbed charge gradient microscopy (CGM).