Apr. 14, 2014
Atomic force microscopy (AFM) has become a promising tool for manipulating nano-objects to fabricate nano-structures or nano-devices. However, there are still some challenges facing the development of an AFM based robotic nanomanipulation system, such as the uncertainties associated with AFM tip and nanoparticles, the single point force and interaction between the tip and nanoparticles, and the parameter calibration of models being used. This work was published in IEEE Nanotechnology Magazine.
moreApr. 11, 2014
An AFM probe is a cantilever, shaped like a tiny diving board with a small, atomic-scale point on the free end. To measure forces at the molecular scale in a liquid, the probe attaches its tip to a molecule such as a protein and pulls; the resulting deflection of the cantilever is measured. The forces are in the realm of piconewtons, or trillionths of a newton. One newton is roughly the weight of a small apple. The new probe design, described in ACS Nano, is the JILA research group's third recent advance in AFM technology.
moreMar. 20, 2014
blueDrive for Asylum Research Cypher AFMs has reinvented tapping mode for more simple, stable and accurate imaging, especially for biological samples that are typically imaged in fluid. blueDrive replaces the conventional piezoacoustic excitation mechanism and uses a blue laser to directly excite the AFM cantilever photothermally.
moreMar. 19, 2014
Horiba Scientific has introduced the XploRA PLUS Raman microscope. XploRA PLUS incorporates unique and powerful research functions in an impressively compact analytical bench footprint.
Offering simplicity, reliability and power, it does not compromise data quality or image resolution. XploRA PLUS is a fully confocal and high performance Raman microscope, offering an unmatched and enhanced range of options such as multiple laser wavelengths, complete automation, EMCCD detection, Raman polarization and even AFM coupling.
moreMar. 19, 2014
Even the mildest form of a traumatic brain injury, better known as a concussion, can deal permanent, irreparable damage. Now, an interdisciplinary team of researchers at the University of Pennsylvania is using mathematical modeling to better understand the mechanisms at play in this kind of injury, with an eye toward protecting the brain from its long-term consequences.
moreMar. 17, 2014
In this paper, we demonstrate the use of atomic force microscopy (AFM) with a conductive cantilever to study local electronic properties of silicon nanostructures: p-i-n radial junctions of amorphous Si grown on Si nanowires. We have observed variations of the conductivity of the radial junction solar cells based on Si nanowires. Finally, we discuss possibilities of comparing the local photoresponse to local photovoltaic conversion efficiency.
moreMar. 10, 2014
In collaboration with colleagues from Berlin and Madrid, researchers at the Department of Physics at the University of Basel have pulled up isolated molecular chains from a gold surface, using the tip of an atomic force microscope (AFM). The observed signal provides insight into the detachment force and binding energy of molecules. The results have been published in the journal PNAS.
moreMar. 06, 2014
Asylum Research, an Oxford Instruments company, invites all Cypher and MFP-3D AFM users to enter their best AFM data, including images, force curves, or videos, in the Asylum Research Image Contest. Each scientist will receive an Asylum gift pack just for sending in their images. An Apple iPad will be awarded at the close of each quarter to the winning image that best represents excellence in science and the "cool" factor as judged by our team of applications scientists. Select entries will also be featured in the Asylum Research website gallery.
moreFeb. 06, 2014
Researchers in the Department of Electrical and Computer Engineering at The University of Texas at Austin (UT ECE) have demonstrated the ability to perform nanoscale chemical analysis of molecular films with unprecedented sensitivity by detecting molecular photoexpansion. PhD students Feng Lu and Mingzhou Jin led by Prof. Mikhail Belkin successfully acquired high-quality infrared spectra from as few as 300 molecules in ambient conditions and achieved better than 25 nm spatial resolution. These capabilities enable a highly-sensitive nanoscale analytical tool for chemists, biologists and materials scientists. The results were published in Nature Photonics.
moreFeb. 03, 2014
Development of advanced materials relies on a detailed understanding of nanoscale morphology and mechanical properties. Atomic Force Microscopy (AFM) has become a key tool in material science by providing this information. Contact Resonance imaging has emerged as a powerful AFM technique for its ability to quantitatively characterize the viscoelastic response of materials, its applicability to a wide range of materials, and its ability to provide this information quickly and at high resolution.