Mar. 06, 2014
Asylum Research, an Oxford Instruments company, invites all Cypher and MFP-3D AFM users to enter their best AFM data, including images, force curves, or videos, in the Asylum Research Image Contest. Each scientist will receive an Asylum gift pack just for sending in their images. An Apple iPad will be awarded at the close of each quarter to the winning image that best represents excellence in science and the "cool" factor as judged by our team of applications scientists. Select entries will also be featured in the Asylum Research website gallery.
moreFeb. 06, 2014
Researchers in the Department of Electrical and Computer Engineering at The University of Texas at Austin (UT ECE) have demonstrated the ability to perform nanoscale chemical analysis of molecular films with unprecedented sensitivity by detecting molecular photoexpansion. PhD students Feng Lu and Mingzhou Jin led by Prof. Mikhail Belkin successfully acquired high-quality infrared spectra from as few as 300 molecules in ambient conditions and achieved better than 25 nm spatial resolution. These capabilities enable a highly-sensitive nanoscale analytical tool for chemists, biologists and materials scientists. The results were published in Nature Photonics.
moreFeb. 03, 2014
Development of advanced materials relies on a detailed understanding of nanoscale morphology and mechanical properties. Atomic Force Microscopy (AFM) has become a key tool in material science by providing this information. Contact Resonance imaging has emerged as a powerful AFM technique for its ability to quantitatively characterize the viscoelastic response of materials, its applicability to a wide range of materials, and its ability to provide this information quickly and at high resolution.
moreJan. 28, 2014
Asylum Research, an Oxford Instruments company, in conjunction with Georg-August Universität Göttingen, announces the 4th Euro AFM Forum. The meeting will take place in Göttingen from 17-19 March 2014 . The Euro AFM Forum is organized as a venue where researchers can share and exchange cutting-edge AFM research in both material and life science disciplines.
moreJan. 20, 2014
Asylum Research has introduced Scanning Microwave Impedance Microscopy (sMIM), an atomic force microscopy (AFM) technique that provides valuable nanomechanical and nanoelectrical information in addition to high resolution AFM topography of permittivity and conductivity on any material including conductors, semiconductors and insulators. sMIM is available integrated exclusively with Asylum Research MFP-3D and Cypher AFMs.
moreJan. 16, 2014
The Atomic Force Microscope (AFM), which uses a fine-tipped probe to scan surfaces at the atomic scale, will soon be augmented with a chemical sensor. This involves the use of a hollow AFM cantilever, through which a liquid - in this case mercury - is passed under pressure. The droplet of mercury at the tip acts as a sensor. This microscopic fountain pen was developed by researchers at the University of Twente's MESA+ Institute for Nanotechnology. Details of the "fountain pen's" mechanism of action were recently published in Analytical Chemistry.
moreJan. 02, 2014
Membrane proteins are the "gatekeepers" that allow information and molecules to pass into and out of a cell. Until recently, the microscopic study of these complex proteins has been restricted due to limitations of "atomic force microscopes" that are available to researchers and the one-dimensional results these microscopes reveal. Now, researchers at the University of Missouri have developed a three-dimensional microscope that will yield unparalleled study of membrane proteins and how they interact on the cellular level. These microscopes could help pharmaceutical companies bring drugs to market faster.
moreDec. 19, 2013
In collaboration with the University of Basel, an international team of researchers has observed a strong energy loss caused by frictional effects in the vicinity of charge density waves. The researchers vibrated the nanometer-sized tip of an atomic force microscope above the surface of a layered structure of niobium and selenium atoms. This may have practical significance in the control of nanoscale friction. The results have been published in the scientific journal Nature Materials.
moreDec. 02, 2013
Comprehensive investigations of geological samples can be challenging due to variations in size, shape, structure and composition. For that reason flexible analysis techniques are required which can be easily adapted to individual sample characteristics.
moreNov. 14, 2013
Why is raman atomic force microscopy needed in scientific application? Which are the advantages and important applications at the moment? Imaging & Microcopy on Tour 2013 presents a brief interview with Thomas Dieing, Director Applications & Support from WITec.