Jan. 11, 2012

Park Systems NX10: Research-Grade True Non-Contact Atomic Force Microscope

Schaefer Technology has introduced the Park Systems NX10, a very accurate Atomic Force Microscope (AFM) which brings high imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price. moreDec. 19, 2011

Multifrequency Atomic Force Microscopy

Multifrequency Atomic Force Microscopy (AFM) involves several force microscopy methods that aim to improve spatial resolution, data acquisition times and quantitative mapping of surface properties with respect to the level that has been achieved by conventional AFM. About twenty years ago, amplitude modulation AFM (tapping-mode) was introduced to avoid the sample modifications introduced by lateral forces that existed during contact AFM operation. moreDec. 09, 2011

JPK Introduces Software With Quantitative Imaging Capabilities For Challenging AFM Samples

JPK Instruments has introduced QI, a quantitative imaging mode for the recently launched NanoWizard 3 AFM system.
The software has been developed to make AFM imaging easier than ever before. With QI, a force curve-based imaging mode, the user has the full control over the tip-sample force at every pixel of the image. There is no need for setpoint or gain adjustment while scanning. moreDec. 06, 2011

Bruker Releases an Integrated System for Correlated Atomic Force Microscopy and Raman Spectroscopic ...

Bruker has released Innova-IRIS, an integrated system for correlated atomic force microscopy and Raman spectroscopic imaging. moreDec. 02, 2011

Innovative Solutions Bulgaria Aquires Bulgaria’s largest MEMS Fab

Innovative Solutions Bulgaria, a manufacturer of BudgetSensors line of AFM probes and AFM calibration standards, has announced the acquisition of Bulgaria's largest MEMS Fab.
MEMS fab is located in the north of Sofia and has been newly built and equipped in 2004. This new facility provides Innovative Solutions Bulgaria with the much needed space for the expansion of its production capacity. moreNov. 03, 2011

Variable Field Module for Magnetic Atomic Force Microscopy Experiments

Asylum Research has launched the Variable Field Module2 (VFM2) for magnetic atomic force microscopy applications with MFP-3D Atomic Force Microscopes (AFM). moreOct. 19, 2011

Daniel Guntli as New COO at NanoWorld

Daniel Guntli, formerly the Assistant General Management, has joined NanoWorld's management team as the new Chief Operating Officer.

"Dr Guntli is ideally positioned to take over the responsibility for our operations. He joined NanoWorld over three years ago and gained in-depth knowledge of NanoWorld's global operational processes and has a track record of successful project management and leadership," said NanoWorld CEO Manfred Detterbeck.
moreOct. 07, 2011

Poster Award in the Field of Scanning Probe Microscopy

The Scanning Probe Microscopy and Optical Tweezers communities are meeting this week at the 10th International Symposium on Scanning Probe Microscopy & Optical Tweezers in Life Sciences in Berlin, Germany to present and discuss their recent results.

The winners of the poster award in the field of Scanning Probe Microscopy are:

1st Place: Huong Nguyen, Max Planck Institute for Polymer Research, Johannes Gutenberg University Mainz, Institute of Pharmacy and Biochemistry, Mainz moreOct. 06, 2011

JPK Instruments Launch the NanoWizard 3 NanoOptics AFM System

JPK Instruments, a  manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, continue to expand its family of  research systems with the availability of the NanoWizard 3 NanoOptics AFM system. The NanoWizard NanoOptics head comes with  physical and optical access to the sample from top and bottom as well as from front and side, even when the head and condenser are in place. Additionally, it has an integrated port for fiber SNOM applications. moreSep. 02, 2011

Combination of Optical Microscopy and AFM-

PicoQuant has combined its time-resolved confocal fluorescence microscope MicroTime200 with Brukers BioScope Catalyst Atomic Force Microscope (AFM). The synchronized acquisition of these two systems enables simultaneous recordings of AFM and optical images of the same sample region and makes new investigation schemes in the f more