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Atomic force microscopy

Scanning Tunnelling Microscopy: Computer Simulations Sharpen Insights Into Molecules
Dec. 02, 2014

Scanning Tunnelling Microscopy: Computer Simulations Sharpen Insights Into Molecules

The resolution of scanning tunnelling microscopes can be improved dramatically by attaching small molecules or atoms to their tip. The resulting images were the first to show the geometric structure of molecules and have generated a lot of interest among scientists over the last few years. Scientists from Forschungszentrum Jülich and the Academy of Sciences of the Czech Republic in Prague have now used computer simulations to gain deeper insights into the physics of these new imaging techniques. One of these techniques was presented in the journal Science by American scientists this spring. The results have now been published in the journal Physical Review Letters. more
Oxford Instruments Asylum Research Receives the 2014 Microscopy Today Innovation Award for blueDrive Photothermal Excitation
Sep. 16, 2014

Oxford Instruments Asylum Research Receives the 2014 Microscopy Today Innovation Award for ...

Oxford Instruments Asylum Research has received the 2014 Microscopy Today Innovation Award for the development of blueDrive Photothermal Excitation. blueDrive, an option available exclusively for Asylum's Cypher Atomic Force Microscopes (AFMs), makes tapping mode imaging remarkably simple, incredibly stable, and strikingly accurate. It replaces the conventional piezoacoustic excitation mechanism of the AFM cantilever by using a blue laser to directly excite the cantilever photothermally. more
Lasers Makes Atomic Force Microscopes Way Cooler
Aug. 25, 2014

Lasers Makes Atomic Force Microscopes Way Cooler

Laser physicists have found a way to make atomic-force microscope probes 20 times more sensitive and capable of detecting forces as small as the weight of an individual virus. The technique, developed by researchers at The Australian National University (ANU), hinges on using laser beams to cool a nanowire probe to minus 265 degrees Celsius. more
AFM and XPS Study of Aminosilanes on Si
Aug. 14, 2014

AFM and XPS Study of Aminosilanes on Si

In this study APTMS and APREMS aminosilanes were used for the modification of silicon, with a purpose for using them in sensor´s applications (detection of explosives like TNT, DNT, RDX, etc.). The morphology and surface chemistry of the modified surfaces were investigated using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). Our results show that the polymerization of aminosilanes and consequently the thickness of the aminosilane layer depend on the number of possible bonding sites of the aminosilane molecule. more
Imaging Polarization Charges Using Charge Gradient Microscopy
Jul. 24, 2014

Imaging Polarization Charges Using Charge Gradient Microscopy

Polarization charges in ferroelectric materials are screened by equal amounts of surface charges with opposite polarity under ambient conditions. Researchers from the Center for Nanoscale Materials, Argonne's Nanoscience & Technology and Materials Science divisions, and Tohoku University have shown that scraping, collecting, and quantifying surface screen charges reveals the underlying polarization domain structure at high speed, a technique dubbed charge gradient microscopy (CGM).
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Atomic Force Microscopy: GaN Nanowires Tips Outperforme Pt Tips in Resolution and Durability
May. 27, 2014

Atomic Force Microscopy: GaN Nanowires Tips Outperforme Pt Tips in Resolution and Durability

In response to requests from the semiconductor industry, a team of PML researchers has demonstrated that atomic force microscope (AFM) probe tips made from its near-perfect gallium nitride nanowires are superior in many respects to standard silicon or platinum tips in measurements of critical importance to microchip fabrication, nanobiotechnology, and other endeavors. more
Synchrotron Infrared Nano-Spectroscopy: Studying Complex Systems on the Nanoscale
May. 15, 2014

Synchrotron Infrared Nano-Spectroscopy: Studying Complex Systems on the Nanoscale

For years, scientists have had an itch they couldn't scratch. Even with the best microscopes and spectrometers, it's been difficult to study and identify molecules at the so-called mesoscale, a region of matter that ranges from 10 to 1000 nanometers in size. Now, with the help of broadband infrared light from the Advanced Light Source (ALS) synchrotron at the U.S. Department of Energy's Lawrence Berkeley National Laboratory (Berkeley Lab), researchers have developed a broadband imaging technique (Synchrotron Infrared Nano-Spectroscopy) that looks inside this realm with unprecedented sensitivity and range. The results have been published in PNAS.
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Oxford Instruments Asylum Research´s MFP-3D Infinity: AFM with Unlimited Potential for Research
May. 08, 2014

Oxford Instruments Asylum Research´s MFP-3D Infinity: AFM with Unlimited Potential for Research

Oxford Instruments Asylum Research's MFP-3D Infinity AFM features a large 90 µm stage and entirely new control electronics that are located close to the AFM for fast, low noise performance. Flexible signal switching and programmable logic enable future expansion options. more
Atomic Force Microscopy: Resolving the Structure of a Single Biological Molecule
Apr. 29, 2014

Atomic Force Microscopy: Resolving the Structure of a Single Biological Molecule

Researchers at the London Centre for Nanotechnology have determined the structure of DNA from measurements on a single molecule using atomic force microscopy, and found that this structure is not as regular as one might think. Results have been published in the journal Small. more
AFM-based Virtual Nanohand Proposed for Stable Nanomanipulation
Apr. 14, 2014

AFM-based Virtual Nanohand Proposed for Stable Nanomanipulation

Atomic force microscopy (AFM) has become a promising tool for manipulating nano-objects to fabricate nano-structures or nano-devices. However, there are still some challenges facing the development of an AFM based robotic nanomanipulation system, such as the uncertainties associated with AFM tip and nanoparticles, the single point force and interaction between the tip and nanoparticles, and the parameter calibration of models being used. This work was published in IEEE Nanotechnology Magazine.
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