Oct. 06, 2017News
Oak Ridge National Laboratory scientists have developed a technique for making ultrafast measurements using atomic force microscopy, which previously could only investigate slow or static material structures and functions.
Sep. 28, 2017News
Tufts researchers have discovered a new, faster way to image materials at the nano level, an advance that could speed the detection of cancer and assist in the development of new high-tech materials. The new method was discovered by Igor ...
Aug. 01, 2017News
Researchers have developed high-speed frequency modulation AFM (FM-AFM) and enabled atomic-resolution imaging in liquid at ∼1 s/frame. With this AFM, the scientists have obtained images revealing the transition region is formed along ...
Jun. 21, 2017Products
Park Systems, world-leading manufacturer of Atomic Force Microscopes (AFM) just announced new Park NX12, an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities.
Jun. 19, 2017Science
We offer a simple explanation of the effect of the higher eigenmode’s free amplitude on probe sensitivity and indentation depth in bimodal atomic force microscopy (AFM). The explanation is based on a qualitative analysis of the ...
May. 31, 2017News
JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, announced a new demonstration capability at their Berlin headquarters. In collaboration with Abberior Instruments, visitors to ...
May. 12, 2017News
Atomic force microscopy (AFM) is an extremely sensitive technique that allows us to image materials and/or characterize their physical properties on the atomic scale by sensing the force above material surfaces using a precisely controlled ...
Apr. 19, 2017News
Park Systems, a manufacturer of atomic force microscopes (AFM) announced the opening of their European Headquarters in Heidelberg, Germany and appointment of Ludger Weisser as General Manager.
Feb. 22, 2017Products
Park Systems has announced that its AFM operating software SmartScan is now available on Park XE series AFMs. The software completely automatizes all of the functions of setting up and taking the image once done manually by the ...
Feb. 16, 2017Products
Oxford Instruments Asylum Research has launched its new European Atomic Force Microscopy (AFM) Probe Store.
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