Apr. 20, 2012

XFlash 6: Pushing the Limits of Energy Resolution

With XFlash 6, Bruker Nano Analytics has introduced the next generation of silicon drift detectors (SDD) for energy dispersive X-ray spectrometry (EDS) on electron microscopes. moreApr. 02, 2012

Bruker Acquires SkyScan

Bruker Corporation announced that it has acquired all of the shares of SkyScan N.V., a scientific instruments company located near Antwerp, Belgium. Financial details were not disclosed. For the remainder for 2012, the acquisition of SkyScan is expected to add approximately US-$ 13 million to Bruker's revenue and to be accretive to EPS by about US-$ 0.01. SkyScan's revenue is derived approximately 50% from materials science and 50% from life science and preclinical imaging applications. moreDec. 06, 2011

Bruker Releases an Integrated System for Correlated Atomic Force Microscopy and Raman Spectroscopic ...

Bruker has released Innova-IRIS, an integrated system for correlated atomic force microscopy and Raman spectroscopic imaging. moreSep. 15, 2011

Bruker to Acquire CETR

Bruker announced the signing of a purchase agreement to acquire Center for Tribology (CETR) for an undisclosed amount. CETR, a privately held corporation located in Silicon Valley in Campbell, CA, is projected to have calendar year 2011 revenue greater than US-$ 10 million and EBITDA greater than US-$ 2 million. The transaction is expected to close at the end of the third quarter of 2011, subject to customary closing conditions. moreSep. 02, 2011

Combination of Optical Microscopy and AFM-

PicoQuant has combined its time-resolved confocal fluorescence microscope MicroTime200 with Brukers BioScope Catalyst Atomic Force Microscope (AFM). The synchronized acquisition of these two systems enables simultaneous recordings of AFM and optical images of the same sample region and makes new investigation schemes in the f moreAug. 16, 2011

Bruker Releases Atomic Force Microscope for Patterned Sapphire Substrate Metrology

With the Dimension Edge PSS Atomic Force Microscope, Bruker has introduced a production-environment Atomic Force Microscope specifically tailored for patterned sapphire substrate (PSS) metrology in high brightness light-emitting diode (HB-LED) manufacturing. moreJul. 10, 2011

Analysis of Boron with Energy Dispersive X-ray Spectrometry

The analysis of light elements (from Be to F, refer to periodic table in fig. 1) presents a special challenge for energy dispersive X-ray spectrometry (EDS). Some of the problems are due to inherent physical effects, while others are technical in nature, relating to the design of the instrument used for analysis and the measurement procedure. Along with the demand for fast and efficient tools for analysis at the micro- and nanometer scale, the need for light element analysis with EDS has grown. moreDec. 08, 2010

Nanoelectrical and Electrochemical AFM Technology

At the Materials Research Society (MRS) Fall 2010 Meeting, Bruker Corporation released a new generation of Atomic Force Microscopy (AFM) modes and measurement modules that transform Bruker's AFM systems into turnkey solutions for nanoscale characterization in renewable energy research. moreAug. 17, 2010

Bruker to Acquire Veeco's Scanning Probe Microscopy (SPM) and Optical Industrial Metrology (OIM) ...

Bruker Corporation announces the signing of an agreement to acquire the Scanning Probe Microscopy (SPM) and Optical Industrial Metrology (OIM) instruments business from Veeco Instruments for US-$ 229 million in cash. The transaction has been approved by the Boards of Directors of both companies and is expected to close during the fourth quarter of 2010, pending regulatory review and subject to customary closing conditions. moreJul. 20, 2010

50 Years of Innovation

For the fourth time Bruker Nano held its annual colloquium for the German speaking countries on June 15th and 16th in Berlin. The colloquium mainly addresses users of analysis systems for electron microscopy. These include energy dispersive X-ray spectrometry (EDS) products for scanning electron microscopes (SEM) and transmission electron microscopes (TEM) as well as electron backscatter diffraction (EBSD) analysis systems for SEM. Apart from Bruker users, interested users of other systems and members of relevant scientific communities are also always welcome. more