Feb. 24, 2010

Bruker AXS Microanalysis Renamed Bruker Nano

Bruker AXS Microanalysis announces the change of its name to Bruker Nano with immediate effect. The decision for this name change was motivated not only by the increasing applications of the Company's traditional products, such as EDS and EBSD analysis systems for electron microscopes and X-ray fluorescence spectrometers, in various fields of nanotechnology, but also by the fact that the Company's product portfolio now includes a range of atomic force microscopes (AFM) for surface characterization on the nanometer and sub-nanometer scale. moreNov. 03, 2009

Nanoscience in SEM and TEM

The development of modern technology affects the science of small objects in two ways. On one hand better means for handling, imaging and analysis of miniature objects are provided, which means we can try and understand our world on a much smaller scale. On the other hand further miniaturization in manufacturing necessitates the control of technological processes at a minimum of one order of magnitude below the aspired device size. The need for rapid and efficient nanoanalysis is growing very quickly. The next generation 22 nm node in microelectronics architecture is approaching. moreNov. 02, 2009

Steel Cleanliness Analysis by SEM/EDS

Steel is often doped or contains oxides or sulphides to give it properties required by the manufacturer. Hence the steel needs to be assessed and graded according to these properties. To grade these properties efficiently, many steel cleanliness standards have been developed over time, some have been around for decades, others less than a year. The standards seek to classify inclusions in steel and sum the total length per unit area. This gives the steel a cleanliness factor or grade.

moreJul. 01, 2007

Thomas Schülein opened EDS Microanalysis Colloquium in Berlin

Thomas Schülein opened EDS Microanalysis Colloquium in Berlin: Exciting new insights into EDS microanalysis were delivered at the colloquium "New developments in EDS Analysis at the Scanning Electron Microscope - 4th Generation Liquid Nitrogen Free Silicon Drift Detectors (SDD)" from June 11th to 12th in Berlin Adlershof. Over 120 scientists from Germany, Austria and Switzerland attended the event initiated by Bruker AXS Microanalysis in cooperation with the Federal Institute for Materials Research & Testing (BAM) and the Physikalisch Technische Bundesanstalt (PTB). more