Apr. 20, 2012

XFlash 6: Pushing the Limits of Energy Resolution

With XFlash 6, Bruker Nano Analytics has introduced the next generation of silicon drift detectors (SDD) for energy dispersive X-ray spectrometry (EDS) on electron microscopes. moreJul. 10, 2011

Analysis of Boron with Energy Dispersive X-ray Spectrometry

The analysis of light elements (from Be to F, refer to periodic table in fig. 1) presents a special challenge for energy dispersive X-ray spectrometry (EDS). Some of the problems are due to inherent physical effects, while others are technical in nature, relating to the design of the instrument used for analysis and the measurement procedure. Along with the demand for fast and efficient tools for analysis at the micro- and nanometer scale, the need for light element analysis with EDS has grown. moreOct. 08, 2010

Bruker Completes Acquisition of Veeco

Bruker Corporation acquisition of Veeco Instruments' Metrology & Instrumentation Group, which includes the AFM, Optical Profiler and Stylus Profiler product lines, is now complete. moreJul. 20, 2010

50 Years of Innovation

For the fourth time Bruker Nano held its annual colloquium for the German speaking countries on June 15th and 16th in Berlin. The colloquium mainly addresses users of analysis systems for electron microscopy. These include energy dispersive X-ray spectrometry (EDS) products for scanning electron microscopes (SEM) and transmission electron microscopes (TEM) as well as electron backscatter diffraction (EBSD) analysis systems for SEM. Apart from Bruker users, interested users of other systems and members of relevant scientific communities are also always welcome. moreJul. 13, 2010

Advances in µ - XRF

The macroscopic properties of technical materials are often determined by their elemental composition. Because most technical materials are inhomogeneous analytical methods are required that allow elemental analysis of these inhomogeneities - not only as a point by point measurement but also as a complete 2D-distribution. Micro X-ray fluorescence (µ XRF) has recently been established for this purpose. moreFeb. 24, 2010

Bruker AXS Microanalysis Renamed Bruker Nano

Bruker AXS Microanalysis announces the change of its name to Bruker Nano with immediate effect. The decision for this name change was motivated not only by the increasing applications of the Company's traditional products, such as EDS and EBSD analysis systems for electron microscopes and X-ray fluorescence spectrometers, in various fields of nanotechnology, but also by the fact that the Company's product portfolio now includes a range of atomic force microscopes (AFM) for surface characterization on the nanometer and sub-nanometer scale. more