Jan. 23, 2012
A simple method to direct identify nanometer sized textures in composite materials by means of AFM Spectroscopy, aiming at recognizing nanometer structures embedded in a sample. It consists in acquiring a set of dynamic data organized in spectroscopy maps and subsequently extracting most valuable information by means of the Principal Component Analysis (PCA) method . In this work we explain the main features of the method and show its application on a nanocomposite sample.
Force Spectroscopy by AFM
moreJul. 01, 2007
Scintillation Detector for LV- SEM: P. Wandrol introduces a new scintillation detector of backscattered electrons that is capable of working at primary beam energy as low as 0.5 keV. Low energy backscattered electrons are accelerated in order to generate a sufficient number of photons. Secondary electrons are deflected back by the energy filter so that the true compositional contrast of the specimen is obtained. The author presents the theoretical models of the detector function and first demonstration images.
J. Micros. 227 (1) 24-29