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compositional contrast

SEM of Biological Samples without Coating
May. 05, 2014

SEM of Biological Samples without Coating

Biological SEM samples usually require a metal coating to avoid charging [1]. However, a good knowledge of the properties and behavior of the samples offers ways to utilize internal electrical conductivity of biological samples for Scanning Electron MIcroscopy (SEM) examination without the need for metal coating. This not only simplifies the preparation, viewing and imaging. It also opens up new ways to examine natural, uncoated surfaces, for example compositional contrast imaging or for the study of adhesion effects. more
Principal Component Analysis in Dynamic Force Spectroscopy
Jan. 23, 2012

Principal Component Analysis in Dynamic Force Spectroscopy

A simple method to direct identify nanometer sized textures in composite materials by means of AFM Spectroscopy, aiming at recognizing nanometer structures embedded in a sample. It consists in acquiring a set of dynamic data organized in spectroscopy maps and subsequently extracting most valuable information by means of the Principal Component Analysis (PCA) method [1]. In this work we explain the main features of the method and show its application on a nanocomposite sample.
Force Spectroscopy by AFM more
Jul. 01, 2007

Scintillation Detector for LV- SEM

Scintillation Detector for LV- SEM: P. Wandrol introduces a new scintillation detector of backscattered electrons that is capable of working at primary beam energy as low as 0.5 keV. Low energy backscattered electrons are accelerated in order to generate a sufficient number of photons. Secondary electrons are deflected back by the energy filter so that the true compositional contrast of the specimen is obtained. The author presents the theoretical models of the detector function and first demonstration images. J. Micros. 227 (1) 24-29 more
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