Nov. 26, 2010
In a large core microscopy facility, instrument performance can decline over time, introducing optical artifacts or distortions into the data. We have selected two commercially available tools which can be used in any facility to monitor changes in optical performance. Using these tools, we have identified objective and alignment problems not visible through typical image collection. A similar approach could be of great benefit to other core microscopy facilities in quality assurance.
moreAug. 25, 2010
The Olympus cellSens deconvolution solution module employs a constrained iterative (CI) algorithm to remove out-of-focus blur in advanced life science imaging. This high-speed operation provides extremely sharp images, as well as near confocal quality, with the ability to correct for any spherical aberrations. Using a specialised and improved algorithm, the deconvolution solution module provides advanced, high-speed image restoration.
moreApr. 14, 2010
Olympus has introduced the Plapon 60xOSC objective lens with an NA of 1.4, offering levels of chromatic aberration correction for life science imaging applications. This super-corrected objective is designed for fluorescence imaging down to 405 nm. It is ideal for use in cell biology and neuroscience, as well as any applications requiring lasers for inter- and intra-cellular imaging of biological specimens.
The lens provides 0.1-0.2 µm of chromatic aberration when working with lasers from 405 to 650 nm.
moreApr. 07, 2010
High Content Screening is a growing discipline in Life Science Research. Leica Microsystems has therefore launched the HCS A High Content Screening Automation package for confocal research microscopes. Combining the strengths of high-resolution confocal point scanners with the LAS AF Matrix M3 software platform delivers a highly flexible tool for processing large amounts of data and automated imaging in multi dimensions at high speed. The HCS A enables researchers to customize confocal microscopes according to current requirements and challenging life science experiments.
moreMar. 10, 2010
To image and measure small structures, forms and surface roughness has become more easy, fast and versatile with the Sensofar PLµ Neox, distributed by the Schaefer-Tec group. The optical profilometers of the PLµ series combine the two complementary measuring techniques of confocal microscopy and interferometry in one and the same instrument. With this, high resolution 3-D imaging and dimensional measurements of nearly all kinds of surfaces are obtained easily and fast.
moreJan. 13, 2010
Nikon Instruments has launched the A1R MP Multiphoton and Confocal microscope system for high speed, high resolution and high sensitivity multiphoton excitation and confocal fluorescence imaging. The A1R MP allows for deeper, faster and sharper imaging, while remaining cell-friendly with fast resonant imaging at up to 420 fps.
moreDec. 23, 2009
In October for the 35th time Nikon announced the winners of the 2009 Nikon Small World Photomicrography Competition. We, the ‘Imaging & Microscopy' team, would like to present you again the kindly provided winning pictures of this years competition.
moreNov. 30, 2009
Leica Microsystems expands its range of objective lenses for confocal microscopy by the objective HCX APO L20x/0.95 IMM for deep imaging.
moreNov. 03, 2009
Surface metrology is quickly emerging as a critical analytical technique to determine the topology of various materials. It can be used to identify corrosion, surface characterization, or to control the quality of different surfaces. Conventional methods such as profilometry, have involved the use of a stylus being dragged along the sample surface. However, this technique can be problematic; it cannot be used on certain materials, such as adhesives, and the dragging process itself may result in inaccurate data being obtained.
moreNov. 03, 2009
Confocal technique and white light interferometry have demonstrated to be suitable for characterization of transparent thick films. Layer's thickness and 3D topographies of its upper and lower interfaces can be determined from the two peaks in the confocal axial response or from the two sets of interference fringes developed during a vertical scan. Refraction index mismatch between immersion medium and layer worsens the performance of these techniques when profiling lower surface.
Surface Profiling Techniques
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