Oct. 23, 2014
Many international researchers joined the 11th Confocal Raman Imaging Symposium from September 29th to October 01st 2014 in Ulm, Germany. The conference is a popular event at which the Raman community can present and discuss its latest scientific results. Talks from various fields of application and over 20 poster presentations provided a comprehensive overview of modern Raman microscopy for the 80 participants. Another conference highlight was the presentation of the new Raman and Scanning Electron Microscope RISE.
moreOct. 13, 2014
Modern optical and optoelectronic devices are composed of different optical materials and photonic structures which need to be analyzed at the microscale. Comprehensive micro-characterization including functional and structural properties mostly requires a combination of different microscopic techniques applied to these devices. In this article the characterization of optical materials with Correlative Light and Electron Microscopy (CLEM) is outlined for the example of a Light Emitting Diode (LED).
moreSep. 16, 2014
Delmic and Phenom World announce DelPhi, the world's first integrated tabletop fluorescence and electron microscope. Delmic produces high performance, user friendly, integrated solutions while Phenom World is a leading producer of electron microscopes. The DelPhi is a complete solution that makes it possible to do fast correlative microscopy with high overlay precision. The system is easy to use for both optical and electron microscopists and makes correlation intuitive and fully automated.
moreJun. 30, 2014
Robust sample preparation is key to any multiuser, high-end electron microscopy facility. At the EMBL our facility is permanently hosting 10 to 15 projects in parallel, and provides service to approximately 50 users per year. Each of these users face a number of different challenges when it comes to sample preparation and have different levels of experience. Our goal is to assist by standardizing methods and developing a toolbox to help projects become feasible and more efficient.
moreJun. 24, 2014
The 14th European Light Microscopy Initiative (ELMI) meeting, which brings together leading scientists from both academia and industry, was held in May at Holmenkollen in Oslo. This year's meeting, playfully described in the closing speeches by one of the Steering Committee as "Exquisite Lifestyle Meets Imaging", was certainly an enjoyable occasion. As many of the participants have been attending regularly since the inception of the ELMI, the start of the conference resembled a family reunion, with greetings and updates between old friends and colleagues. This intimate and relaxed atmosphere continued throughout the 4-day schedule.
moreMar. 28, 2014
WITec and Tescan have introduced RISE Microscopy, a correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system.
moreMar. 27, 2014
RISE Microscopy is a novel correlative microscopy technique that combines Scanning Electron Microscopy (SEM) and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
moreMar. 11, 2014
The conference "Trends in Micoscopy 2014" will take place from March 27 -29 in Freiburg, Germany. The conference brings together leading high-end microscope techniques developers and users from Germany with their world-wide colleagues.
moreJan. 06, 2014
The 14th European Light Microscopy Initiative (ELMI2014) conference will be held in Oslo, Norway from May 20-23, 2014. ELMI is an internationally recognized meeting on Light Microscopy and offers a unique combination of lectures, exhibitions and hands-on workshops organized by leading microscopy companies. The meeting is aimed at a life sciences audience and specifically focuses on close collaborative interactions between companies, developers and researchers. Imaging methods from a wide range of research fields will be presented that are relevant to both new and expert users of electronic and photonic methods.
moreSep. 10, 2013
The ability to efficiently and reliably locate and image an area of interest in a larger three dimensional sample remains a very challenging application in advanced microscopy. Approaches to address this issue include dedicated sample preparation steps to cut out the target area, or optical penetration using dedicated confocal systems. Both approaches are labor intense and cannot be automated easily. With X-ray microscopy, a new technology has evolved that shows a huge potential to bridge the gap between light and electron microscopy.