Jan. 12, 2015
The Analytical Scientist Innovation Awards (TASIAs) recognize top innovations in the field of analytical chemistry. A jury of three independent experts and The Analytical Scientist editorial team chose the Raman Imaging and Scanning Electron (RISE) Microscope from the German microscope manufacturer WITec as the second 2014 TASIA winner.
moreJan. 02, 2015
mmc2015 will be one of Europe's largest conference and exhibition dedicated to microscopy and imaging and will take place from June 29 - July 2, 2015 in Manchester, UK. For the first time the mmc series will incorporate EMAG, providing an unprecedented opportunity to present your work to an audience that will include the biggest and brightest names in both the life and physical sciences, and in light and electron microscopy.
moreDec. 01, 2014
RISE Microscopy has been nominated for a 2015 Photonics Prism Award. These well-respected product innovation awards honor the best new photonic products on the market and are each year presented by SPIE and Photonics Media at a gala event during Photonics West in San Francisco. RISE microscopy is a correlative microscopy technique combining the chemical analysis power of Raman imaging with the ultra-structural characterization capabilities of a scanning electron microscope in an integrated system.
moreOct. 23, 2014
Many international researchers joined the 11th Confocal Raman Imaging Symposium from September 29th to October 01st 2014 in Ulm, Germany. The conference is a popular event at which the Raman community can present and discuss its latest scientific results. Talks from various fields of application and over 20 poster presentations provided a comprehensive overview of modern Raman microscopy for the 80 participants. Another conference highlight was the presentation of the new Raman and Scanning Electron Microscope RISE.
moreOct. 13, 2014
Modern optical and optoelectronic devices are composed of different optical materials and photonic structures which need to be analyzed at the microscale. Comprehensive micro-characterization including functional and structural properties mostly requires a combination of different microscopic techniques applied to these devices. In this article the characterization of optical materials with Correlative Light and Electron Microscopy (CLEM) is outlined for the example of a Light Emitting Diode (LED).
moreSep. 16, 2014
Delmic and Phenom World announce DelPhi, the world's first integrated tabletop fluorescence and electron microscope. Delmic produces high performance, user friendly, integrated solutions while Phenom World is a leading producer of electron microscopes. The DelPhi is a complete solution that makes it possible to do fast correlative microscopy with high overlay precision. The system is easy to use for both optical and electron microscopists and makes correlation intuitive and fully automated.
moreJun. 30, 2014
Robust sample preparation is key to any multiuser, high-end electron microscopy facility. At the EMBL our facility is permanently hosting 10 to 15 projects in parallel, and provides service to approximately 50 users per year. Each of these users face a number of different challenges when it comes to sample preparation and have different levels of experience. Our goal is to assist by standardizing methods and developing a toolbox to help projects become feasible and more efficient.
moreJun. 24, 2014
The 14th European Light Microscopy Initiative (ELMI) meeting, which brings together leading scientists from both academia and industry, was held in May at Holmenkollen in Oslo. This year's meeting, playfully described in the closing speeches by one of the Steering Committee as "Exquisite Lifestyle Meets Imaging", was certainly an enjoyable occasion. As many of the participants have been attending regularly since the inception of the ELMI, the start of the conference resembled a family reunion, with greetings and updates between old friends and colleagues. This intimate and relaxed atmosphere continued throughout the 4-day schedule.
moreMar. 28, 2014
WITec and Tescan have introduced RISE Microscopy, a correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system.
moreMar. 27, 2014
RISE Microscopy is a novel correlative microscopy technique that combines Scanning Electron Microscopy (SEM) and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.