May. 18, 2010

Seamless Integration of Atomic Force and Light Microscopy

Agilent Technologies announced the availability of the Agilent 6000ILM AFM, an atomic force microscopy (AFM) platform. The Platform is a research solution that seamlessly integrates the capabilities of an AFM with those of an inverted light microscope or an inverted confocal microscope. The 6000ILM supports a wide variety of scanning probe microscopy imaging modes and lets life science researchers go beyond the optical diffraction limit to achieve nanoscale spatial resolution with unprecedented ease of use. more