Jun. 23, 2010

Automated Sample Prep (ASaP) System

The powerful and flexible Model 1030 Automated Sample Prep (ASaP) System prepares samples that have been created by cleaving, grinding, cutting, or sectioning. The final sample configuration is ideal for analysis in a scanning electron microscope (SEM).
Processing with the ASaP significantly enhances the image quality and analytical data obtained from the sample. Operation is fully programmable and automatic, completing sample preparation rapidly enough for high-throughput applications. moreOct. 11, 2009

Scanning and Transmission

E. A. Fischione Instruments has introduced new products for scanning and transmission electron microscopy sample preparation. The Model 1030 Automated Sample Preparation System (ASaP) for scanning electron microscopy samples, incorporates plasma cleaning, ion beam etching (IBE), reactive ion etching (RIE), and ion beam sputter coating (IBSC) in one integrated package. The system allows final artefact-free preparation of samples that have been created by cleaving, grinding, cutting or sectioning. more