Feb. 06, 2012

TEAM Pegasus: Next Generation in Synergistic Materials Characterization

Edax has introduced the TEAM Pegasus system, which combines Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) hardware with EDAX's TEAM software platform to create the next generation in synergistic materials characterization. moreSep. 05, 2011

Phase Growth in Wire Bond Interconnects - Microstructural Characterization by EBSD

Gold wire bonding on aluminium pads plays an important role in microelectronic packaging. The reliability and lifetime of the interconnection is determined by intermetallic phases formed at the Au/Al interface. Five phases are stable at room temperature. Some of them are supposed to undergo degradation pro­cesses due to mechanical stress or chemical reactions during IC lifetime. For microstructural characterization, investigations by EBSD are applied as an alternative to expensive TEM analyses.

Introduction
moreDec. 26, 2010

Desktop Sample Cleaning System from Hitachi

Desktop Sample Cleaner from Hitachi: Hitachi High-Technologies has launched the ZONESem desktop EM sample cleaner, specifically designed for cleaning and storing electron microscopy samples in readiness for high quality imaging and analysis. The Hitachi ZONESem utilizes a non-destructive UV cleaning process to quickly remove surface hydrocarbons from SEM samples. moreSep. 17, 2010

Big Vacuum Chamber, Deep Insights

Carl Zeiss SMT introduced a new family member of Auriga CrossBeam (FIB-SEM) workstation featuring a large six inch stage vacuum chamber and a total of 23 free accessory ports. The new AURIGA 60 platform essentially broadens the application spectrum of the Zeiss CrossBeam technology. Its vacuum chamber is large enough to handle wafers of up to six inch diameter, at the same time. The huge chamber offers the capability to attach up to 23 analytical or other attachments for diverse chemical or physical experiments. moreSep. 14, 2010

A World Novelty in Electron Microscopy

FIBLYS (or FIB anaLYSis) is a project to design and build united nano-structuring, nano-manipulation, nano-analytic and nano-vision capabilities in one unique ‘multi-nano' tool. It is based on a dual Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) together with Atomic Force Microscope (AFM). FIB enables modification of samples, SEM fast real-time imaging while AFM provides the depth information. moreJul. 20, 2010

50 Years of Innovation

For the fourth time Bruker Nano held its annual colloquium for the German speaking countries on June 15th and 16th in Berlin. The colloquium mainly addresses users of analysis systems for electron microscopy. These include energy dispersive X-ray spectrometry (EDS) products for scanning electron microscopes (SEM) and transmission electron microscopes (TEM) as well as electron backscatter diffraction (EBSD) analysis systems for SEM. Apart from Bruker users, interested users of other systems and members of relevant scientific communities are also always welcome. moreFeb. 24, 2010

Bruker AXS Microanalysis Renamed Bruker Nano

Bruker AXS Microanalysis announces the change of its name to Bruker Nano with immediate effect. The decision for this name change was motivated not only by the increasing applications of the Company's traditional products, such as EDS and EBSD analysis systems for electron microscopes and X-ray fluorescence spectrometers, in various fields of nanotechnology, but also by the fact that the Company's product portfolio now includes a range of atomic force microscopes (AFM) for surface characterization on the nanometer and sub-nanometer scale. moreDec. 23, 2009

Apollo SDD Series for EDS Analysis

EDAX has introduced the next series of Apollo SDD detectors for X-ray microanalysis. "While the Apollo Series offers a range of detector sizes and performance levels including a large-area SDD chip," notes Judy O'Loughlin, Director of Product Marketing for EDAX, "it emphasizes a more important feature, the positioning of the detectors close to the sample, making it comparable to the best-designed Si(Li) detectors. EDAX's Apollo Series offers users the best of both worlds. All SDDs are able to map at high resolution, and all SDDs can map at high count rates. moreNov. 30, 2009

Next Generation in Analytical EM

Carl Zeiss announced launches of product and application innovations. The start of this series is marked by the next-generation analytical field emission scanning electron microscope - the Merlin. This instrument combines requirements of ultra-high resolution imaging and analytical capabilities. "Customers have a need for more than just high resolution images of their samples," Dr. moreNov. 17, 2009

Highly Flexible CrossBeam Workstation

To study the chemical analysis, crystallographic information, the complete morphology, electrical information of various FIB-SEM samples, the Auriga Workstation from Carl Zeiss NTS features redesigned vacuum chamber, which includes a total of 15 ports for different detectors. Additionally, a charge compensation system enables the local application of an inert gas flush. In this way, electrostatic charging of non-conductive samples is neutralized and detection of secondary electrons (SE) as well as backscattered electrons (BSE) becomes feasible. more