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EDS
3D Elemental Mapping in the ESEM - A Combination of Serial Block-face SEM and EDS
The combination of serial block-face scanning electron microscopy and energy dispersive x-ray spectroscopy (EDS) is demonstrated for 3D elemental analysis of materials, enabling investigations of large sample volumes compared to other tomographic techniques. The approach involves cutting a stack of 200 slices from an aluminum-copper alloy specimen and generating EDS maps after each cut. more
Analysis of Boron with Energy Dispersive X-ray Spectrometry
The analysis of light elements (from Be to F, refer to periodic table in fig. 1) presents a special challenge for energy dispersive X-ray spectrometry (EDS). Some of the problems are due to inherent physical effects, while others are technical in nature, relating to the design of the instrument used for analysis and the measurement procedure. Along with the demand for fast and efficient tools for analysis at the micro- and nanometer scale, the need for light element analysis with EDS has grown. more
Jeol Introduces Multi-Touch Screen Interface for Scanning Electron Microscopy
Jeol has announced that they now offer InTouch Scope, an analytical, low vacuum Scanning Electron Microscope (SEM) with integrated EDS analysis and multi-touch screen functionality. more
50 Years of Innovation
For the fourth time Bruker Nano held its annual colloquium for the German speaking countries on June 15th and 16th in Berlin. The colloquium mainly addresses users of analysis systems for electron microscopy. These include energy dispersive X-ray spectrometry (EDS) products for scanning electron microscopes (SEM) and transmission electron microscopes (TEM) as well as electron backscatter diffraction (EBSD) analysis systems for SEM. Apart from Bruker users, interested users of other systems and members of relevant scientific communities are also always welcome. more
Modular Coating Systems
Electron Microscopy Sciences is pleased to offer the EMS 150R, a compact rotary-pumped coating system. The EMS 150R boasts high quality performance and flexibility and is suited for SEM and other coating applications. more
EDS Using an SDD with X-ray Optic
Organic and mineral samples, containing light elements like oxygen, nitrogen or beryllium have been analyzed using an attachable X-ray optic with an SDD in SEM. Compared to the measurements without the additional optic, there is a significant increase of the detection sensitivity for X-rays in the energy range below 1 keV. In contrast the spectrum above 1 keV is not affected. The optic can provide similar intensities for low and high energy X-ray lines even at high accelerating voltage. Introduction moreFeb. 24, 2010Bruker AXS Microanalysis Renamed Bruker Nano
Bruker AXS Microanalysis announces the change of its name to Bruker Nano with immediate effect. The decision for this name change was motivated not only by the increasing applications of the Company's traditional products, such as EDS and EBSD analysis systems for electron microscopes and X-ray fluorescence spectrometers, in various fields of nanotechnology, but also by the fact that the Company's product portfolio now includes a range of atomic force microscopes (AFM) for surface characterization on the nanometer and sub-nanometer scale. more
Launch of Next-Generation Tabletop SEM
Hitachi High-Technologies Corporation announced the development of the Tabletop Microscope TM3000. Shipments of the compact, affordably priced, and exceptionally user-friendly TM3000 are scheduled to start on April 1, 2010. more
Next Generation in Analytical EM
Carl Zeiss announced launches of product and application innovations. The start of this series is marked by the next-generation analytical field emission scanning electron microscope - the Merlin. This instrument combines requirements of ultra-high resolution imaging and analytical capabilities. "Customers have a need for more than just high resolution images of their samples," Dr. moreNov. 17, 2009Highly Flexible CrossBeam Workstation
To study the chemical analysis, crystallographic information, the complete morphology, electrical information of various FIB-SEM samples, the Auriga Workstation from Carl Zeiss NTS features redesigned vacuum chamber, which includes a total of 15 ports for different detectors. Additionally, a charge compensation system enables the local application of an inert gas flush. In this way, electrostatic charging of non-conductive samples is neutralized and detection of secondary electrons (SE) as well as backscattered electrons (BSE) becomes feasible. more- Legal
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