Apr. 20, 2012

XFlash 6: Pushing the Limits of Energy Resolution

With XFlash 6, Bruker Nano Analytics has introduced the next generation of silicon drift detectors (SDD) for energy dispersive X-ray spectrometry (EDS) on electron microscopes. moreFeb. 06, 2012

TEAM Pegasus: Next Generation in Synergistic Materials Characterization

Edax has introduced the TEAM Pegasus system, which combines Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) hardware with EDAX's TEAM software platform to create the next generation in synergistic materials characterization. moreMar. 21, 2011

Jeol Introduces Multi-Touch Screen Interface for Scanning Electron Microscopy

Jeol has announced that they now offer InTouch Scope, an analytical, low vacuum Scanning Electron Microscope (SEM) with integrated EDS analysis and multi-touch screen functionality. moreDec. 23, 2009

Apollo SDD Series for EDS Analysis

EDAX has introduced the next series of Apollo SDD detectors for X-ray microanalysis. "While the Apollo Series offers a range of detector sizes and performance levels including a large-area SDD chip," notes Judy O'Loughlin, Director of Product Marketing for EDAX, "it emphasizes a more important feature, the positioning of the detectors close to the sample, making it comparable to the best-designed Si(Li) detectors. EDAX's Apollo Series offers users the best of both worlds. All SDDs are able to map at high resolution, and all SDDs can map at high count rates. moreJun. 01, 2008

FIB/SEM for Biological Data Mining

PART I more