May. 04, 2011

X-Ray Spectroscopy Enables Elemental Mapping at the Atomic-Level

FEI Company has announced that elemental mapping at the atomic-level is now possible across the periodic table using ChemiSTEM Technology.
The combination of increased current in an atomic-sized probe by Cs-correction and the increase in X-ray detection sensitivity and beam current of the ChemiSTEM Technology allows results to be obtained within minutes. moreNov. 03, 2009

Analytical Power for the Sub-Nanometer World

In recent years there has been an ongoing trend to design specialized scanning electron microscopes, dedicated to specific applications. As a result two different system configurations in the SEM market have emerged: One configuration is dedicated to deliver high resolution imaging. The other configuration is dedicated to optimized analytical performance. However, these two diverging development lines force users to decide whether they will limit their research to high resolution imaging or optimized analytical investigations. more