Nov. 16, 2011

FEI Buys TILL Photonics

FEI, a instrumentation company providing imaging and analysis systems for research and industry, announced that it has acquired TILL Photonics of Munich, Germany. TILL provides high resolution, digital light microscopes and high speed imaging systems for live cell fluorescence microscopy. moreAug. 09, 2011

Elemental Mapping with High Resolution: FEI's Titan G2 80-200 with ChemiSTEM Technology

FEI Company announced the release of its Titan G2 80-200 with ChemiSTEM Technology, a new member of the Titan G2 series of S/TEM (scanning / transmission electron microscopes).
moreMay. 04, 2011

X-Ray Spectroscopy Enables Elemental Mapping at the Atomic-Level

FEI Company has announced that elemental mapping at the atomic-level is now possible across the periodic table using ChemiSTEM Technology.
The combination of increased current in an atomic-sized probe by Cs-correction and the increase in X-ray detection sensitivity and beam current of the ChemiSTEM Technology allows results to be obtained within minutes. moreJan. 06, 2011

FEI Wins Multi-System Order

FEI Company, a instrumentation company providing electron microscope systems for applications in research and industry, announced that the CANMET Materials Technology Laboratory (CANMET-MTL), a research center funded by the Canadian government, has selected three of FEI's latest electron microscope systems for its new facility at the McMaster Innovation Park, Hamilton, Ontario. moreFeb. 08, 2010

Quarterly Bookings Up 9% Sequentially

FEI Company reported fourth quarter revenue that was the highest for any quarter in the company's history. Fourth quarter bookings were also strong and the company ended the year with a record backlog. For the full year, operating income increased on a 4% decline in revenue. For the fourth quarter, net bookings were US-$ 163.3 million. Bookings were 9% above third-quarter bookings of  US-$ 149.7 million and 6% above last year's fourth quarter total of US-$ 153.8 million. moreNov. 14, 2009

New Solution for Gunshot Residue Analysis

FEI Company announced the release of two dedicated scanning electron microscopes (SEMs) and a new software package for automated analysis of gunshot residues (GSR). The GSR S50 and GSR F50 SEMs include the released Magnum GSR software and specially-modified hardware to provide fully-automated analysis with novel improvements in speed, accuracy and affordability. GSR analysis uses high-resolution SEM imaging to locate residue particles, and X-ray spectrometry to determine their elemental composition. moreNov. 01, 2007

Microscopy Conference (MC) 2007

Microscopy Conference (MC) 2007. At the university campus of Saarbrücken, the capital of Saarland, Germany's smallest federal state, well known in the past for its iron producing industry, with the world cultural heritage "Völklinger Hütte", the 33rd conference of the German Society of Electron Microscopy (DGE) took place between 2nd and 7th of September. moreJan. 01, 2007

Advanced 3D Research and Development

Advanced 3D Research and Development: Combining FEI's latest advances in ion and electron optics and the unique environmental SEM technology of FEI's Quanta family of products, the new system eliminates the boundaries imposed by traditional high vacuum systems. The Quanta 3D FEG expands FEI's range of DualBeam solutions for Nano­Research and Industry, Nano­Biology and NanoElectronics. The advances incorporated in the Quanta 3D provide users with new levels of versatility and flexibility. moreMay. 31, 2005

Fei Company: Nova NanoSEM (SEM for Ultra-High Resolution Characterization)

Fei Company: Nova NanoSEM (SEM for Ultra-High Resolution Characterization). Fei Company released the newest member of its Nova family of SEM and Dual- Beam systems, the Nova NanoSEM. It is the world’s first low-vacuum, field emission scanning electron microscope (FEGSEM) solution for ultra-high resolution characterization of charging and/or contaminating samples such as organic materials, substrates, porous materials, plastics and polymers. moreMay. 31, 2005

Fei: Titan 80-300

Fei: Titan 80-300. Fei announced its new scanning/transmission electron microscope (S/TEM), the Titan 80-300, dedicated to corrected microscopy. The system is the world’s most advanced commercially-available microscope, yielding atomic-scale imaging with resolution below 0.7 Ångström. The Titan announcement comes just one year after FEI became the first developer and manufacturer of commercial electron microscopes to achieve subÅngström resolution on FEI’s marketleading Tecnai microscope, using a monochromator and an aberration corrector. more