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Focussed Ion Beam (FIB)

Tensile Testing of Microstructures
May. 13, 2011

Tensile Testing of Microstructures

The small size of micro- and nano-structures makes tensile testing challenging. In this study we meet this challenge by combined use of a Focussed Ion Beam (FIB) in Dual Beam configuration, an AFM-cantilever, and a micromanipulator which provide the required accuracy and versatility to measure the mechanical properties of nanowires by tensile testing. AFM cantilevers with a big range of force constants principally enable us to measure the tensile behavior of a great variety of materials. more
Advanced Electron Microscopy in Life Sciences
Jun. 01, 2008

Advanced Electron Microscopy in Life Sciences

In the past decades, high-throughput technologies were developed with the aim to unravel the secret of life. In the genomics project many genomes were sequenced, including the human genome. We ended up with a lot of data but no real clue if and at what point of time a certain illness will manifest, finally not the gene but the presence or absence of the responsible protein will be decisive. Therefore, proteomics came into reach and focus of research. Again we ended up with a wealth of data but still the final answer cannot be found. more
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