Aug. 17, 2011

The National Institute of Materials Physics Gets High-Tech Devices for Material Analysis

The National Institute of Materials Physics (NIMP) in Magurele near Bucharest, Romania were equipped with apparatus for complex examination and characterization of the microstructure of materials. moreFeb. 24, 2010

Atomic Resolution Data in Record Time

The Jeol JEM-ARM200F TEM is the first transmission electron microscope to be installed at the University of Texas at San Antonio, USA, in January, and by early February began producing imaging results. The microscpope represents more than 60 years of TEM expertise and was designed from the ground up to integrate aberration correction into a super-shielded electron column that safeguards the ultrahigh-powered optics from environmental interferences. more