Nov. 03, 2009

Optical Metrology Made Easy

Surface metrology is quickly emerging as a critical analytical technique to determine the topology of various materials. It can be used to identify corrosion, surface characterization, or to control the quality of different surfaces. Conventional methods such as profilometry, have involved the use of a stylus being dragged along the sample surface. However, this technique can be problematic; it cannot be used on certain materials, such as adhesives, and the dragging process itself may result in inaccurate data being obtained. moreOct. 11, 2009

LEXT - High resolution 3D Surface Profile

LEXT is utilising low wave length optical technology with a 408nm laser in combination with confocal scanning to exceed known resolution limits of optical imaging systems. By developing a special optical system which minimises the aberrations associated with short wavelength and maximises the transmission at 408nm Olympus achieved unequalled image quality and signal response. moreMay. 31, 2005

UV-Laser Confocal Microscopy

UV-Laser Confocal Microscopy. High Resolution 3D Surface Profile Observation and Measurement with UV-Laser Confocal Microscopy. Olympus has developed LEXT – a new confocal laser scanning microscope for ultra-precise measurement and observation with the highest levels of reliability. No sample preparation is required, and samples can be placed directly on the microscope stage as they are. Both 3D observation and high-precision 3D measurements are possible in real time. more