Mar. 15, 2018Products
The Triple Ion Beam Milling System, Leica EM TIC 3X allows production of cross sections and planed surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations.
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. An integrated stereomicroscope allows pinpointing and easy preparation of barely ...
Mar. 14, 2018Products
High quality sectioning of specimens for light, electron, and atomic force microscopy examination has never been easier and more precise. Leica Microsystems introduces its latest specimen preparation technology: the Leica EM UC7 ...
Nov. 02, 2017Products
The leading scientific equipment manufacturing company Anton Paar is announcing the launch of Tosca analysis software, based on Digital Surf’s Mountains surface analysis technology.
Sep. 18, 2017Products
Sensofar Metrology has developed new innovative software features for their 3-in-1 S-line 3D surface metrology systems. Two new measurement technologies – Confocal Fusion and Continuous Confocal - represent significant new ...
Jun. 21, 2017Products
Park Systems, world-leading manufacturer of Atomic Force Microscopes (AFM) just announced new Park NX12, an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities.
Apr. 05, 2017Products
A dedicated software for Scanning Electron Microscopy based on Mountains Technology has been introduced by Hitachi High-Technologies.
Feb. 22, 2017Products
Park Systems has announced that its AFM operating software SmartScan is now available on Park XE series AFMs. The software completely automatizes all of the functions of setting up and taking the image once done manually by the ...
Feb. 16, 2017Products
Oxford Instruments Asylum Research has launched its new European Atomic Force Microscopy (AFM) Probe Store.
Nov. 28, 2016Applications
Correlative microscopy is widely used for materials analysis. The combination of confocal Raman microscopy for revealing molecular data and other methods for imaging the morphology of a sample allows for exceptional correlation of chemical ...
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