Feb. 07, 2012

True Surface Microscopy for Topographic Confocal Raman Imaging

Confocal Raman imaging opened the door for many applications in Raman spectroscopy and imaging that were previously unavailable for measurement with conventional (non-confocal) Raman methods. However, high confocality always results in high focus sensitivity and this can make measurements difficult with rough and/or inclined samples. Especially when performing scans on a larger scale (scan size larger than 1 mm), this often necessitated careful alignment and extensive sample preparation. moreFeb. 06, 2012

TEAM Pegasus: Next Generation in Synergistic Materials Characterization

Edax has introduced the TEAM Pegasus system, which combines Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) hardware with EDAX's TEAM software platform to create the next generation in synergistic materials characterization. moreJan. 04, 2012

Ametek Acquires Technical Manufacturing Corporation

Ametek Inc. has acquired Technical Manufacturing Corporation (TMC) , a world leader in high-performance vibration isolation systems and optical test benches used to isolate highly sensitive instruments for the microelectronics, life sciences, photonics and ultra-precision manufacturing industries.
The privately held manufacturer, headquartered in Peabody, MA, has estimated annual sales of approximately $30 million. moreDec. 12, 2011

Sharpening the Focus of Microscopes

A new advanced imaging scheme-with a resolution ten times better than that of its counterparts to date-can resolve objects as small as atoms. Previously, the maximum resolution of optical instruments, including cameras and microscopes, was fundamentally limited to a precision that corresponded to approximately half of the wavelength of incoming light. moreSep. 19, 2011

VM12 Strengthing by Precipitates - TEM Study of Precipitates in the Martensitic VM12 Steel

Martensitic VM12 steel was recently developed for advanced coal-fired power stations. Its creep resistance is dependent on a stability of microstructure. Destabilization of microstructure is caused by recovery and softening processes of a tempered martensite and depends on changes of a dislocation substructure and morphology of secondary particles during creep. Quantitative TEM analyses of VM12 steel were ­undertaken to determine the microstructure parameters after creep at 625°C up to 30.000h.

Experimental
moreAug. 19, 2011

EMAG 2011 – Quantifying the Nanoworld

EMAG 2011: The Electron Microscopy and Analysis Group's (EMAG) biennial conference has established a strong reputation as a key event in the calendars of the national and international microscopy communities, since its inaugural meeting in 1946 (then known as the Electron Microscopy Group). It has always sought to capture the latest in the development and applications of electron microscope techniques.
moreJul. 28, 2011

Quantaurus-Tau from Hamamatsu: Fluorescence Lifetime Measurement With Single-Photon-Counting ...

Quantaurus-Tau from Hamamatsu Photonics is a compact, easy-to use system for measuring the fluorescence lifetime of photoluminescent materials in thin film, powder, solid, or liquid form from sub-nanoseconds to the millisecond range, with single-photon-counting sensitivity. moreMay. 31, 2011

Synchrotron X-ray Technique for Chemical Analysis of Rare Materials

Scientists from Finland and France have developed a new synchrotron X-ray technique that may revolutionise the chemical analysis of rare materials like meteoric rock samples or fossils. The results have been published on 29 May 2011 in Nature Materials as an advance online publication.
moreMay. 30, 2011

Transmission Electron Microscopy: 3D Mapping of Crystal Structure with Nanometer Resolution

Using transmission electron microscopy, the 3D mapping of the crystal structure inside a material down to nanometer resolution is now possible with a new method developed by scientists from Risø DTU, Denmark in collaboration with scientists from China and USA. moreMay. 13, 2011

Tensile Testing of Microstructures

The small size of micro- and nano-structures makes tensile testing challenging. In this study we meet this challenge by combined use of a Focussed Ion Beam (FIB) in Dual Beam configuration, an AFM-cantilever, and a micromanipulator which provide the required accuracy and versatility to measure the mechanical properties of nanowires by tensile testing. AFM cantilevers with a big range of force constants principally enable us to measure the tensile behavior of a great variety of materials. more