Aug. 28, 2012
Cambridge Technology Systems has reported about the new ultra high resolution objective lens of the Hitachi S5200 FESEM.
The objective lens now allows 0.5nm imaging at 30kV and improved performance at low kV operation conditions. Cambridge Technology Systems has available a guaranteed second user instrument of this type at considerable saving on new cost with engineer installation included. Engineer support is also available throughout the EU.
moreAug. 23, 2012
Opto-digital technology is the core competence of Olympus, creating innovative imaging solutions for all application areas and via its subsidiary Olympus Soft Imaging Solutions - electron microscopy solutions since 1987. Knowing what gets the client a step further and being foresight, flexible and modular when seeking for sophisticated solutions and exciting cooperation's leads towards real consultancy and fascinated solutions.
moreJul. 18, 2012
Since its discovery in the 1980s, scanning tunneling microscopy (STM) has been a powerful tool for exploring the nanoscale due to its capabilities for atomic-resolution imaging, tunneling spectroscopy, and atom/molecule manipulation. These unique capabilities of STM enable studies of problems related to the scaling of conventional information technologies to atomic dimensions, and provide opportunities for studying the fundamental bases of novel paradigms. For example, molecule-based devices are of interest for next-generation technologies due to the easy tunability of organic molecules with relatively simple chemical methodologies. This motivates our STM studies of organic-metal interfaces and metallo-organic complexes at the single molecule level.
moreJun. 11, 2012
Continuing technological advances require the element analysis of increasingly smaller structures in many fields of materials science, including semiconductors and nanotechnology in general. The element composition of thin electron transparent samples can be analyzed in the nm-range using transmission electron microscopes (TEM) or, specific sample holders provided, in the field emission scanning electron microscope (FE-SEM). Nevertheless both methods often require complex sample preparation. An alternative method is to analyze bulk samples with a FE-SEM.
moreMay. 14, 2012
This Transmission Electron Microscope (TEM) investigation uses the retrieved complex exit-wave function in combination with the geometric phase analysis (GPA) to analyze strain located at faceted Al-Pb hetero-interfaces. It was found that the outer regions of a Pb nanoparticle were strained (compressed) which explains, according to the Clapeyron equation, an elevated melting in terms of interface strain.
moreMay. 10, 2012
With Axio Zoom. V16, Carl Zeiss has introduced a microscope which combines the advantages of stereomicroscopes such as zoom, working distance and larger object fields with higher aperture, contrast and imaging facilities from compound microscopes.
moreApr. 27, 2012
Digital Surf has announced that Polytec will update TMS-Report software to the latest generation of Digital Surf's Mountains Technology.
The TMS-Report software is an advanced surface analysis solution for Polytec's TopMap and TopSens surface topography analyzer product lines. The software is available on different levels and significantly extends the capabilities of Polytec's TMS-software for surface data acquisition and evaluation.
moreApr. 19, 2012
A new x-ray microscope probes the inner intricacies of materials smaller than human cells and creates unparalleled high-resolution 3D images. By integrating unique automatic calibrations, scientists at the U.S. Department of Energy's Brookhaven National Laboratory are able to capture and combine thousands of images with greater speed and precision than any other microscope.
moreMar. 29, 2012
Navitar has introduced a versatile dual view imaging system, allowing customers to simultaneously view a single subject and capture an image at multiple fields of view (FOV).
moreMar. 28, 2012
Rigaku Corporation has added MiniFlex 600 and MiniFlex 300 to its MiniFlex series of benchtop X-ray diffraction (XRD) analyzers.
The 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials.
Key Features of MiniFlex 600
◦ 600 W X-ray Source
◦ Fast Analysis
◦ Improved Overall Throughput
◦ D/teX High Speed detector (Optional)