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Shear Localization in Gamma-Based Titanium Aluminides
Apr. 19, 2012

Shear Localization in Gamma-Based Titanium Aluminides

Hot-working of intermetallic γ titanium aluminides is often hampered by their liability to shear localization and subsequent crack formation, thereby preventing a refinement of the microstructure by dynamic recrystallization. The mechanisms leading to shear localization and cracking were microstructurally analyzed using scanning (SEM) and transmission (TEM) electron microscopic techniques.
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FIB-SEM with Laser Option
Apr. 17, 2012

FIB-SEM with Laser Option

Scanning Electron Microscopy (SEM) has become a valuable tool for two- and three-dimensional characterization of micro- and nano-scale samples. A wide range of industry applications stand to benefit from this technology, e.g., materials research, development of pharmaceutical products, and process development in semiconductor or photovoltaic manufacturing. What they have in common: a specific region of a specimen has to be analyzed. more
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