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ContourGT-K: Scalable Microscope for Combined Optical Surface Metrology and Imaging
Mar. 25, 2013

ContourGT-K: Scalable Microscope for Combined Optical Surface Metrology and Imaging

Bruker has introduced ContourGT-K, a scalable 3D optical microscope for combined surface metrology and imaging. The system's gage-capable, streamlined design includes integrated air isolation for robust vibration tolerance in even challenging production environments. The microscope also incorporates the latest version Bruker Vision64 software and a library of pre-programmed filters and analyses for easy access to advanced measurements for LED, solar cell, thick films, semiconductor, ophthalmic, medical device, MEMS and tribology applications.
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Analysis Software from Digital Surf is Integrated in Confovi´s ConfoCAM LED Grid-Confocal Measuring Systems
Mar. 26, 2012

Analysis Software from Digital Surf is Integrated in Confovi´s ConfoCAM LED Grid-Confocal Measuring ...

Digital Surf has announced that they come together with Confovis to integrate the imaging and analyis software solution MountainsMap in Confovi´s grid-confocal measuring systems ConfoCAM LED. more
JPK Introduces Software With Quantitative Imaging Capabilities For Challenging AFM Samples
Dec. 09, 2011

JPK Introduces Software With Quantitative Imaging Capabilities For Challenging AFM Samples

JPK Instruments has introduced QI, a quantitative imaging mode for the recently launched NanoWizard 3 AFM system.
The software has been developed to make AFM imaging easier than ever before. With QI, a force curve-based imaging mode, the user has the full control over the tip-sample force at every pixel of the image. There is no need for setpoint or gain adjustment while scanning. more
Tensile Testing of Microstructures
May. 13, 2011

Tensile Testing of Microstructures

The small size of micro- and nano-structures makes tensile testing challenging. In this study we meet this challenge by combined use of a Focussed Ion Beam (FIB) in Dual Beam configuration, an AFM-cantilever, and a micromanipulator which provide the required accuracy and versatility to measure the mechanical properties of nanowires by tensile testing. AFM cantilevers with a big range of force constants principally enable us to measure the tensile behavior of a great variety of materials. more
Feb. 22, 2011

Tescan Installs VEGA 3 Scanning Electron Microscope at MIT

Tescan has delivered a VEGA 3 Scanning Electron Microscope to the Massachusetts Institute of Technology (MIT), the world's 4th best university according to the ARWU (Academic Ranking of World Universities) rankings. more
Custom Manufactured Silicon Devices for Microscopists
Oct. 08, 2010

Custom Manufactured Silicon Devices for Microscopists

As applications become more demanding, very precise films and supports are required. These challenges may be addressed by the custom fabrication services of Agar Scientific´s US-bases partners, TEMwindows.
TEMwindows provides solutions to challenging customisation applications. Using expertise in ultrathin supported films and MEMs processes, the company's experienced technologists carry out custom design, deposition etching, inspection and packaging projects. These enable quick turn-around times while maintaining high product quality at all levels of the fabrication process. more
Optical Metrology Made Easy
Nov. 03, 2009

Optical Metrology Made Easy

Surface metrology is quickly emerging as a critical analytical technique to determine the topology of various materials. It can be used to identify corrosion, surface characterization, or to control the quality of different surfaces. Conventional methods such as profilometry, have involved the use of a stylus being dragged along the sample surface. However, this technique can be problematic; it cannot be used on certain materials, such as adhesives, and the dragging process itself may result in inaccurate data being obtained. more
Analytical TEM: Electron Microscopy Facility at Caesar
Jul. 01, 2007

Analytical TEM: Electron Microscopy Facility at Caesar

Analytical TEM: Electron Microscopy Facility at Caesar - Bonn-Plittersdorf nearby the former government district is the destination of the center of advanced European studies and research - caesar. The international research center was established in 1999 as largest single measure within the Bonn-Berlin Act. caesar conducts research in interdisciplinary teams in the areas of biotechnology and materials sciences. more
Jan. 01, 2007

Optical Profilers

Optical Profilers: Veeco Instruments announced the release of the Wyko NT9300 and NT9800 Optical Profilers. The new NT optical profilers are ideal for non-contact surface metrology in a wide range of demanding industrial, research, and production applications including automotive, aerospace, semiconductor, MEMS, and biomedical devices. more
3D Measurements of Surface Topography and Vibrations
Mar. 01, 2005

3D Measurements of Surface Topography and Vibrations

3D Measurements of Surface Topography and Vibrations. On a (Sub)micrometric Scale by Interferometric Microscopy and Laser Doppler Vibrometry. The French company Fogale Nanotech, specialist of high precision dimensional measurements, has also developed a pool of competences in the field of optical measurements, in particular in the interferometric and vibrometric techniques.
Microelectronics, aeronautics, glass industry, iron and steel industry, characterisation of optical systems are some of the areas where Fogale measurement systems are already well established. more
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