Mar. 25, 2013
Bruker has introduced ContourGT-K, a scalable 3D optical microscope for combined surface metrology and imaging. The system's gage-capable, streamlined design includes integrated air isolation for robust vibration tolerance in even challenging production environments. The microscope also incorporates the latest version Bruker Vision64 software and a library of pre-programmed filters and analyses for easy access to advanced measurements for LED, solar cell, thick films, semiconductor, ophthalmic, medical device, MEMS and tribology applications.
moreMar. 26, 2012
Digital Surf has announced that they come together with Confovis to integrate the imaging and analyis software solution MountainsMap in Confovi´s grid-confocal measuring systems ConfoCAM LED.
moreDec. 09, 2011
JPK Instruments has introduced QI, a quantitative imaging mode for the recently launched NanoWizard 3 AFM system.
The software has been developed to make AFM imaging easier than ever before. With QI, a force curve-based imaging mode, the user has the full control over the tip-sample force at every pixel of the image. There is no need for setpoint or gain adjustment while scanning.
moreMay. 13, 2011
The small size of micro- and nano-structures makes tensile testing challenging. In this study we meet this challenge by combined use of a Focussed Ion Beam (FIB) in Dual Beam configuration, an AFM-cantilever, and a micromanipulator which provide the required accuracy and versatility to measure the mechanical properties of nanowires by tensile testing. AFM cantilevers with a big range of force constants principally enable us to measure the tensile behavior of a great variety of materials.
moreFeb. 22, 2011
Tescan has delivered a VEGA 3 Scanning Electron Microscope to the Massachusetts Institute of Technology (MIT), the world's 4th best university according to the ARWU (Academic Ranking of World Universities) rankings.
moreOct. 08, 2010
As applications become more demanding, very precise films and supports are required. These challenges may be addressed by the custom fabrication services of Agar Scientific´s US-bases partners, TEMwindows.
TEMwindows provides solutions to challenging customisation applications. Using expertise in ultrathin supported films and MEMs processes, the company's experienced technologists carry out custom design, deposition etching, inspection and packaging projects. These enable quick turn-around times while maintaining high product quality at all levels of the fabrication process.
moreNov. 03, 2009
Surface metrology is quickly emerging as a critical analytical technique to determine the topology of various materials. It can be used to identify corrosion, surface characterization, or to control the quality of different surfaces. Conventional methods such as profilometry, have involved the use of a stylus being dragged along the sample surface. However, this technique can be problematic; it cannot be used on certain materials, such as adhesives, and the dragging process itself may result in inaccurate data being obtained.
moreJul. 01, 2007
Analytical TEM: Electron Microscopy Facility at Caesar - Bonn-Plittersdorf nearby the former government district is the destination of the center of advanced European studies and research - caesar. The international research center was established in 1999 as largest single measure within the Bonn-Berlin Act. caesar conducts research in interdisciplinary teams in the areas of biotechnology and materials sciences.
moreJan. 01, 2007
Optical Profilers: Veeco Instruments announced the release of the Wyko NT9300 and NT9800 Optical Profilers. The new NT optical profilers are ideal for non-contact surface metrology in a wide range of demanding industrial, research, and production applications including automotive, aerospace, semiconductor, MEMS, and biomedical devices.
moreFeb. 01, 2006
Digital Holographic Microscopy (DHM): 3D Real-Time Optical Imaging at the Nanometer Scale. Digital Holographic Microscopes (DHM) enables strictly noninvasive visualisation of unstained transparent and partially reflective specimens, in real time, by providing simultaneously amplitude and phase changes of a light wave transmitted or reflected.