Oct. 04, 2011

Plasma FIB-FESEM Workstation Introduced By Tescan

Tescan has launched the FERA3 XMH - a high resolution Schottky Field Emission scanning electron microscope with a fully integrated Plasma source focused ion beam. The system has been developed in co-operation with the French company Orsay Physics.  moreSep. 14, 2010

A World Novelty in Electron Microscopy

FIBLYS (or FIB anaLYSis) is a project to design and build united nano-structuring, nano-manipulation, nano-analytic and nano-vision capabilities in one unique ‘multi-nano' tool. It is based on a dual Focused Ion Beam (FIB) and Scanning Electron Microscope (SEM) together with Atomic Force Microscope (AFM). FIB enables modification of samples, SEM fast real-time imaging while AFM provides the depth information. moreApr. 26, 2010

Microscopy & Nanomanipulation

PI's P-563.3CD PIMars stage is a piezo flexure-guided scanning / nanomanipulation system. The unit enables precision motion control with resolution in the sub-nanometer realm and 340x340x340 µm travel in XYZ. Integrated, direct-measuring capacitance sensors and digital closed-loop control boost linearity by up to three orders of magnitude over conventional piezo stages. The product incorporate high-force solid state piezo actuator drives, frictionless flexure guiding systems and absolute measuring capacitive position sensors. more