Apr. 27, 2012

TMS-Report Software Integrates Digital Surf’s Mountains Technology

Digital Surf has announced that Polytec will update TMS-Report software to the latest generation of Digital Surf's Mountains Technology.
The TMS-Report software is an advanced surface analysis solution for Polytec's TopMap and TopSens surface topography analyzer product lines. The software is available on different levels and significantly extends the capabilities of Polytec's TMS-software for surface data acquisition and evaluation. moreApr. 20, 2012

XFlash 6: Pushing the Limits of Energy Resolution

With XFlash 6, Bruker Nano Analytics has introduced the next generation of silicon drift detectors (SDD) for energy dispersive X-ray spectrometry (EDS) on electron microscopes. moreFeb. 21, 2011

X-Max EDS-Detector from Oxford Instruments: 1000th was installed

Oxford Instruments has completed the installation of its 1000th X-Max:
X-Max was introduced to the market over two years ago and was the world's first "Large Area" silicon drift detector with an effective sensor area of 80mm2. The installation of the 1000th X-Max took place at Atotech in Berlin, Germany. moreFeb. 03, 2011

Sample Preparation for SEM, TEM and AFM

Agar Scientific announce their appointment by Dune Sciences for the supply of SMART Grids to simplify nano- and bioanalysis sample preparation. Applying surface chemistry, SMART Grids characterization substrates capture both biological and nanomaterials through attraction or self-assembly enabling opportunities for integrative analysis and processing. SMART Grids are tools for enhanced analytical characterization and the development of new nanoscale materials. moreNov. 01, 2008

Enabling 360 degree TEM/STEM of Nanoparticles

A new protocol for functionalizing sample holders has been developed for 360° TEM/STEM observation of nanoparticles and nanostructures. The three step process includes FIB milling to customize sample stub geometry, thin film deposition for substrate selection and subsequent chemical functionalization for nanoparticle adhesion. This protocol was used to determine the morphology and local material properties of individual Au/SiO2 core-shell nanoparticles used in a DNA detection assay.

Nanoscience Imaging & Spectroscopy
moreNov. 01, 2007

360° TEM/STEM Nanoanalysis: Functionalized Holders for 3D Electron Microscopy

360° TEM/STEM Nanoanalysis: Functionalized Holders for 3D Electron Microscopy. A new protocol for functionalizing sample holders has been developed for 360° TEM/STEM observation of nanoparticles and nanostructures. The three step process includes FIB milling to customize sample stub geometry, thin film deposition for substrate selection and subsequent chemical functionalization for nanoparticle adhesion. This protocol was used to determine the morphology and local material properties of individual Au/SiO2 core-shell nanoparticles used in a DNA detection assay. more