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Focussed Electron Beam Induced Processing: Improving VCSE Lasers
The vertical cavity surface emitting laser (VCSEL) is a semiconductor laser which is often used in data transmission for short-distance links like Gigabit Ethernet. These lasers are very popular in telecommunications because they consume little energy and can be simply fabricated in volumes of many tens of thousands on a single wafer. more
3D Nanometer-Scale Characterization: Helios NanoLab DualBeam System from FEI
FEI has announced a solution for 3D, nanometer-scale characterization of pore networks. The Helios NanoLab DualBeam system images kerogen, porosity and microstructures in three dimensions (3D) with nanometer-scale resolution. The data are essential to determining the production potential of unconventional gas reservoirs, optimizing extraction procedures and designing simulators of the nanoscale pore structure. more
Nanoelectrical and Electrochemical AFM Technology
At the Materials Research Society (MRS) Fall 2010 Meeting, Bruker Corporation released a new generation of Atomic Force Microscopy (AFM) modes and measurement modules that transform Bruker's AFM systems into turnkey solutions for nanoscale characterization in renewable energy research. more
The Willis E. Lamb Award for Laser Science and Quantum Optics
Ben-Gurion University of the Negev's Prof. Ron Folman has been named as a recipient of the prestigious 2011 Willis E. Lamb Award for Laser Science and Quantum Optics. more
Seamless Integration of Atomic Force and Light Microscopy
Agilent Technologies announced the availability of the Agilent 6000ILM AFM, an atomic force microscopy (AFM) platform. The Platform is a research solution that seamlessly integrates the capabilities of an AFM with those of an inverted light microscope or an inverted confocal microscope. The 6000ILM supports a wide variety of scanning probe microscopy imaging modes and lets life science researchers go beyond the optical diffraction limit to achieve nanoscale spatial resolution with unprecedented ease of use. more
Nanoscale Infrared Spectroscopy Technology
Anasys Instruments introduced the nanoIR platform, a new measurement tool that reveals the chemical composition of samples at the nanoscale. The goal of nanoIR technology is to overcome major barriers in AFM and conventional IR spectroscopy, said Dr. Craig Prater, Anasys Instruments' chief technology officer. The nanoIR system combines the nanoscale spatial resolution capabilities of atomic force microscopy (AFM) with infrared spectroscopy's ability to characterize and identify chemical species. more
Electron Energy Loss Spectroscopy
The combination of high resolution imaging with energy loss spectroscopy allows to resolve questions about the morphology, structure, composition and electronic structure of a material in a single instrument. By the assistance of band structure calculations and simulated EELS spectra, the experimental data can be analyzed in detail. Following this approach it is possible to study the relation between the geometric and electronic structure of materials at the nanometer scale.Introduction
moreJan. 01, 2008
Nanoscale VI 2008
Seeing at the Nanoscale VI welcomes you to the annual scientific conference focusing on nanostructural imaging, characterization, and modification using scanning probe microscopy (SPM) and related techniques.The conference takes place in the center of Berlin, Germany. It is held from July 9-11, 2008. The event includes technical presentations, a nanotechnology poster contest and a gala dinner. Seeing at the Nanoscale VI is sponsored by Veeco Instruments and supported by Humboldt University Berlin, Department of Physics. more
Verifying Engineering at Nanoscale: Electron Microscopy & Drug Delivery
Verifying Engineering at Nanoscale: Electron Microscopy & Drug Delivery. Packaging drugs and genes into nanoparticles enables drug or gene biodistribution to be favourably altered, with an ultimate therapeutic benefit [1-3]. To acquire such control on the in vivo fate of drugs and genes requires that such particles be precision engineered and electron microscopy is one of the techniques used to visualise and confirm the results of such engineering. Methods more
Analytical TEM: Electron Microscopy Facility at Caesar
Analytical TEM: Electron Microscopy Facility at Caesar - Bonn-Plittersdorf nearby the former government district is the destination of the center of advanced European studies and research - caesar. The international research center was established in 1999 as largest single measure within the Bonn-Berlin Act. caesar conducts research in interdisciplinary teams in the areas of biotechnology and materials sciences. more- Legal
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