Dec. 12, 2012

Interdisciplinary Nanoscience Center Uses AFM Force Spectroscopy to Work at the Interface Between ...

The group of Dr Rikke Meyer from the interdisciplinary Nanoscience Center (iNANO) at Aarhus University, Denmark has used AFM and single-cell force spectroscopy to work at the interface between microbiology and nanoscience in the quest to understand how bacteria form biofilms and how this may be prevented. moreApr. 24, 2012

ICN+T 2012 - International Conference on Nanoscience and Nanotechnology

The International Conference on Nanoscience + Technology (ICN+T) will take place from 23-27 July in Paris, France. The conference will provide an international forum for discussion of the latest developments in nanoscale science and technology and recent advances in scanning probe microscopy and related techniques.

Plenary Speakers are: moreNov. 03, 2009

Nanoscience in SEM and TEM

The development of modern technology affects the science of small objects in two ways. On one hand better means for handling, imaging and analysis of miniature objects are provided, which means we can try and understand our world on a much smaller scale. On the other hand further miniaturization in manufacturing necessitates the control of technological processes at a minimum of one order of magnitude below the aspired device size. The need for rapid and efficient nanoanalysis is growing very quickly. The next generation 22 nm node in microelectronics architecture is approaching. moreNov. 01, 2008

Enabling 360 degree TEM/STEM of Nanoparticles

A new protocol for functionalizing sample holders has been developed for 360° TEM/STEM observation of nanoparticles and nanostructures. The three step process includes FIB milling to customize sample stub geometry, thin film deposition for substrate selection and subsequent chemical functionalization for nanoparticle adhesion. This protocol was used to determine the morphology and local material properties of individual Au/SiO2 core-shell nanoparticles used in a DNA detection assay.

Nanoscience Imaging & Spectroscopy
moreJan. 01, 2008

S. Larcheri: Nanoscience Tool

The International team of S. Larcheri presented a device to investigate the structure and electronic properties of materials at the nanometer scale. They combine x-ray absorption spectroscopy (XAS) using synchrotron radiation microbeams with scanning near-field optical microscopy (SNOM) detection of the x-ray excited optical luminescence (XEOL) signal. This new instrumentation offers the possibility to carry out a selective structural analysis of the sample surface with the subwavelength spatial resolution determined by the SNOM probe aperture. moreNov. 01, 2007

360° TEM/STEM Nanoanalysis: Functionalized Holders for 3D Electron Microscopy

360° TEM/STEM Nanoanalysis: Functionalized Holders for 3D Electron Microscopy. A new protocol for functionalizing sample holders has been developed for 360° TEM/STEM observation of nanoparticles and nanostructures. The three step process includes FIB milling to customize sample stub geometry, thin film deposition for substrate selection and subsequent chemical functionalization for nanoparticle adhesion. This protocol was used to determine the morphology and local material properties of individual Au/SiO2 core-shell nanoparticles used in a DNA detection assay. more