Apr. 14, 2014
Atomic force microscopy (AFM) has become a promising tool for manipulating nano-objects to fabricate nano-structures or nano-devices. However, there are still some challenges facing the development of an AFM based robotic nanomanipulation system, such as the uncertainties associated with AFM tip and nanoparticles, the single point force and interaction between the tip and nanoparticles, and the parameter calibration of models being used. This work was published in IEEE Nanotechnology Magazine.
moreMar. 25, 2014
PML researchers have devised an idea for determining the three-dimensional shape of features as small as 10 nanometers wide. The model-based method compares data from scanning electron microscope (SEM) images with stored entries in a library of three dimensional (3D) shapes to find a match and to determine the shape of the sample. The work provides a powerful new way to characterize nanostructures.
moreMar. 20, 2014
The term a "brighter future" might be a cliché, but in the case of ultra-small probes for lighting up individual proteins, it is now most appropriate. Researchers at the U.S. Department of Energy (DOE)'s Lawrence Berkeley National Laboratory (Berkeley Lab) have discovered surprising new rules for creating ultra-bright light-emitting crystals that are less than 10 nanometers in diameter. These ultra-tiny but ultra-bright nanoprobes should be a big asset for biological imaging, especially deep-tissue optical imaging of neurons in the brain.
moreMar. 06, 2014
Munich-based nanotechnology specialist attocube took over the majority share in Neaspec by mid-February. Neaspec - a company based in Martinsried close to Munich - specializes in developing scanning near-field optical microscopes (SNOM).
moreFeb. 13, 2014
Oxford Instruments, a provider of high-technology tools for industry and research has recently acquired Andor. Andor is a supplier of high performance cameras, microscope systems and software for the physical science and life science industries. Andor will continue to focus on growing their existing core markets and will spearhead Oxford Instruments strategic expansion into the Nano-Bio arena.
moreFeb. 03, 2014
Development of advanced materials relies on a detailed understanding of nanoscale morphology and mechanical properties. Atomic Force Microscopy (AFM) has become a key tool in material science by providing this information. Contact Resonance imaging has emerged as a powerful AFM technique for its ability to quantitatively characterize the viscoelastic response of materials, its applicability to a wide range of materials, and its ability to provide this information quickly and at high resolution.
moreJan. 27, 2014
When capturing images at the atomic scale, even tiny movements of the sample can result in skewed or distorted images - and those movements are virtually impossible to prevent. Now microscopy researchers at North Carolina State University have developed a new technique that accounts for that movement and eliminates the distortion from the finished product.
moreJan. 14, 2014
The efficiency of the new method is based on a X-ray focussing optics being firmly fixed to the object to be imaged. While this approach initially provides a blurry image, this can be focussed in the computer based on the hologram information. At the same time, the rigid connection between the object and the focussing optics elegantly solves the problem of vibration induced jitter that plays an enormous role at the nanometre scale.
moreJan. 03, 2014
The global microscopes market and related accessories industry is suggested to have reached a value of around US-$ 3.8 billion at the end of 2012, and is estimated to reach a total of over US-$ 4 billion during 2013. By 2018, the industry is forecast to hit a value of US-$ 5.4 billion, and is suggested to grow at a CAGR growth rate of around 6% between 2013 and 2018.
moreDec. 19, 2013
In collaboration with the University of Basel, an international team of researchers has observed a strong energy loss caused by frictional effects in the vicinity of charge density waves. The researchers vibrated the nanometer-sized tip of an atomic force microscope above the surface of a layered structure of niobium and selenium atoms. This may have practical significance in the control of nanoscale friction. The results have been published in the scientific journal Nature Materials.