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Nanotechnology

Microscopic Study of Nanostructured AlOx
Jul. 17, 2014

Microscopic Study of Nanostructured AlOx

Large area ordered nanopatterning of RF sputtered AlOx layers have been carried out. The technique involves UV laser treating of the film through LB films of silica nanospheres. The hexagonal, close packed arrangement of these spheres was projected to the surface due to the laser treatment resulting in ordered structure of pits of ~200 nm diameter and 1.3 nm depths. The samples were characterized by means of AFM and XTEM. Experimental results are in good agreement with the simulations.
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TEM Sample Preparation of Nanoparticles in Suspensions
Jul. 07, 2014

TEM Sample Preparation of Nanoparticles in Suspensions

Nanomaterials are of significant economic interest with a global market value of roughly 20 billion €, which is expected to rise to 2 trillion € by 2015 [1]. For commercial use, the European Union provides the following recommended definition: "‘Nanomaterial' means a natural, incidental or manufactured material containing particles, in an unbound state or as an aggregate or as an agglomerate and where, for 50% or more of the particles in the number size distribution, one or more external dimensions is in the size range 1 nm-100 nm" [2].
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Highly Non-Linear Metamaterials for Laser Technology
Jul. 05, 2014

Highly Non-Linear Metamaterials for Laser Technology

Nonlinear optical materials are widely used in laser systems. However, high light intensity and long propagation are required to produce strong nonlinear optical effects. Researchers at The University of Texas at Austin and the Technische Universitaet Muenchen created metamaterials with a million times stronger nonlinear optical response, compared to the traditional nonlinear materials, and demonstrated frequency conversion in films 100 times thinner than human hair using light intensity comparable to that of a laser pointer.
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Nano-Imaging Probes Structural Disorder in Organic Semiconductor
Jun. 16, 2014

Nano-Imaging Probes Structural Disorder in Organic Semiconductor

Using a newly developed nano-imaging method, LMU researchers show that thin-film organic semiconductors contain regions of structural disorder that could inhibit the transport of charge and limit the efficiency of organic electronic devices. The results have been published in Nature Communications.
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Atomic Force Microscopy: GaN Nanowires Tips Outperforme Pt Tips in Resolution and Durability
May. 27, 2014

Atomic Force Microscopy: GaN Nanowires Tips Outperforme Pt Tips in Resolution and Durability

In response to requests from the semiconductor industry, a team of PML researchers has demonstrated that atomic force microscope (AFM) probe tips made from its near-perfect gallium nitride nanowires are superior in many respects to standard silicon or platinum tips in measurements of critical importance to microchip fabrication, nanobiotechnology, and other endeavors. more
CLUE: Cathodoluminescence Solutions for Electron Microscopy
May. 22, 2014

CLUE: Cathodoluminescence Solutions for Electron Microscopy

Horiba Scientific, with its long expertise in spectroscopy, has developed comprehensive Cathodoluminescence (CL) solutions based on a modular and flexible platform, it is a non-destructive method adapted to a broad range of applications: Semiconductors, Photovoltaics, Optoelectronics, nano-materials, ceramics, Geology/Mineralogy, Life Science Forensics...
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Horiba LabRAM HR Evolution: Raman Imaging of Low Frequency Bands
Apr. 24, 2014

Horiba LabRAM HR Evolution: Raman Imaging of Low Frequency Bands

There are two methods to determine the number of layers of nano-materials like Graphene or Molybdenum disulfide (MoS2) with Raman spectroscopy: Measuring the intralayer vibrational modes (fingerprint spectral region) and measuring the interlayer modes (very low frequencies region).
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AFM-based Virtual Nanohand Proposed for Stable Nanomanipulation
Apr. 14, 2014

AFM-based Virtual Nanohand Proposed for Stable Nanomanipulation

Atomic force microscopy (AFM) has become a promising tool for manipulating nano-objects to fabricate nano-structures or nano-devices. However, there are still some challenges facing the development of an AFM based robotic nanomanipulation system, such as the uncertainties associated with AFM tip and nanoparticles, the single point force and interaction between the tip and nanoparticles, and the parameter calibration of models being used. This work was published in IEEE Nanotechnology Magazine.
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Scanning Electron Microscopy: 3D SEM Metrology for 10 nm Structures
Mar. 25, 2014

Scanning Electron Microscopy: 3D SEM Metrology for 10 nm Structures

PML researchers have devised an idea for determining the three-dimensional shape of features as small as 10 nanometers wide. The model-based method compares data from scanning electron microscope (SEM) images with stored entries in a library of three dimensional (3D) shapes to find a match and to determine the shape of the sample. The work provides a powerful new way to characterize nanostructures.
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Single-Particle Imaging: Bright Future for Protein Nanoprobes
Mar. 20, 2014

Single-Particle Imaging: Bright Future for Protein Nanoprobes

The term a "brighter future" might be a cliché, but in the case of ultra-small probes for lighting up individual proteins, it is now most appropriate. Researchers at the U.S. Department of Energy (DOE)'s Lawrence Berkeley National Laboratory (Berkeley Lab) have discovered surprising new rules for creating ultra-bright light-emitting crystals that are less than 10 nanometers in diameter. These ultra-tiny but ultra-bright nanoprobes should be a big asset for biological imaging, especially deep-tissue optical imaging of neurons in the brain. more
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