You are here: Home

NanoWizard 3

JPK Introduces Software With Quantitative Imaging Capabilities For Challenging AFM Samples
Dec. 09, 2011

JPK Introduces Software With Quantitative Imaging Capabilities For Challenging AFM Samples

JPK Instruments has introduced QI, a quantitative imaging mode for the recently launched NanoWizard 3 AFM system.
The software has been developed to make AFM imaging easier than ever before. With QI, a force curve-based imaging mode, the user has the full control over the tip-sample force at every pixel of the image. There is no need for setpoint or gain adjustment while scanning. more
JPK Instruments Launch the NanoWizard 3 NanoOptics AFM System
Oct. 06, 2011

JPK Instruments Launch the NanoWizard 3 NanoOptics AFM System

JPK Instruments, a  manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, continue to expand its family of  research systems with the availability of the NanoWizard 3 NanoOptics AFM system. The NanoWizard NanoOptics head comes with  physical and optical access to the sample from top and bottom as well as from front and side, even when the head and condenser are in place. Additionally, it has an integrated port for fiber SNOM applications. more
NanoWizard 3 NanoScience System from JPK: AFM Performance in Liquids and Air, Integrated with Optical Microscopy
Mar. 28, 2011

NanoWizard 3 NanoScience System from JPK: AFM Performance in Liquids and Air, Integrated with ...

JPK Instruments, a manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, continues to expand its family of high performance research systems with the announcement of the availability of the NanoWizard 3 NanoScience AFM system.
more
RSS Newsletter