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NanoWizard AFM imaging

JPK Introduces Software With Quantitative Imaging Capabilities For Challenging AFM Samples
Dec. 09, 2011

JPK Introduces Software With Quantitative Imaging Capabilities For Challenging AFM Samples

JPK Instruments has introduced QI, a quantitative imaging mode for the recently launched NanoWizard 3 AFM system.
The software has been developed to make AFM imaging easier than ever before. With QI, a force curve-based imaging mode, the user has the full control over the tip-sample force at every pixel of the image. There is no need for setpoint or gain adjustment while scanning. more
Combined Optical/AFM Technology
Dec. 07, 2009

Combined Optical/AFM Technology

Andor Technology announced the support for all Andor imaging EMCCD cameras within JPK Instruments products for nano-biotechnology.
With the addition of support for the EMCCD cameras to the software, true integration is obtained between fluorescence imaging on the one hand and NanoWizard AFM imaging or NanoTracker optical tweezers on the other. Scientists using the DirectOverlay functionality can now directly use the images coming from their EMCCD cameras. more
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