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Near-field Microscopy

Analysing Nanoscale Materials with Near-field Scanning Microwave Microscopy
Oct. 02, 2012

Analysing Nanoscale Materials with Near-field Scanning Microwave Microscopy

With a new near-field scanning microwave microscope (NSMM) researchers from the National Institute of Standards and Technology (NIST) will improve the ability to determine the composition and physics of nanoscale materials and devices dramatically.

Few techniques can make measurements of equivalent resolution for such a wide range of samples, including semiconductors, semiconducting nanowire, materials for photovoltaic applications, magnetic materials, multiferroic materials, and even proteins and DNA. more
Terahertz Near-field Microscopy: Electrons Confined Inside Nano-pyramids
Oct. 01, 2012

Terahertz Near-field Microscopy: Electrons Confined Inside Nano-pyramids

Quantum dots are nanostructures of semiconducting materials that behave a lot like single atoms and are very easy to produce. Given their special properties, researchers see huge potential for quantum dots in technological applications. Before this can happen, however, we need a better understanding of how the electrons "trapped" inside them behave. Dresden physicists have recently observed how electrons in individual quantum dots absorb energy and emit it again as light. more
Near-Field Microscopy with Superlenses
Feb. 06, 2012

Near-Field Microscopy with Superlenses

Conventional imaging devices are limited in their resolution and, hence, restrict the insights into structures smaller than the wavelength. Near-field microscopy overcomes this limitation by probing evanescent fields resulting in a wavelength-independent resolution. A superlens is a planar device, which transforms these fields to an image plane. We study such lenses for the infrared based on perovskite oxides, which might be applicable to imaging of highly-damped samples e.g. in liquids. more
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