Oct. 02, 2012
With a new near-field scanning microwave microscope (NSMM) researchers from the National Institute of Standards and Technology (NIST) will improve the ability to determine the composition and physics of nanoscale materials and devices dramatically.
Few techniques can make measurements of equivalent resolution for such a wide range of samples, including semiconductors, semiconducting nanowire, materials for photovoltaic applications, magnetic materials, multiferroic materials, and even proteins and DNA.
moreOct. 01, 2012
Quantum dots are nanostructures of semiconducting materials that behave a lot like single atoms and are very easy to produce. Given their special properties, researchers see huge potential for quantum dots in technological applications. Before this can happen, however, we need a better understanding of how the electrons "trapped" inside them behave. Dresden physicists have recently observed how electrons in individual quantum dots absorb energy and emit it again as light.
moreFeb. 06, 2012
Conventional imaging devices are limited in their resolution and, hence, restrict the insights into structures smaller than the wavelength. Near-field microscopy overcomes this limitation by probing evanescent fields resulting in a wavelength-independent resolution. A superlens is a planar device, which transforms these fields to an image plane. We study such lenses for the infrared based on perovskite oxides, which might be applicable to imaging of highly-damped samples e.g. in liquids.