May. 16, 2010

High Linearity in Atomic Force Microscopy

Park Systems XE (which stands for crosstalk elimination) Atomic Force Microscopes provide completely eliminated background curvature thanks to the flexure XY scanners and show no bowing even on scans of the flattest samples. This enables precision nanometrology for challenging problems in research and industry. Position sensors provide linear feedback control for high accuracy, high precision measurements. more