Jun. 06, 2012
The International Conference on Scanning Probe Microscopy on Soft and Polymeric Materials 2012, SPM on SPM 2012, will take place between September 23rd and 26th 2012 in Rolduc Abbey in Kerkrade (The Netherlands). With this topical conference the organizers aim at bringing together researchers from academia as well as industrial participants from all continents to discuss and share the most recent developments in the application of Scanning Probe Microscopy on Soft and Polymeric Materials.
moreMay. 07, 2012
Despite the success of the Atomic Force Microscope operating in intermittent contact for microstructural characterization, important questions remain about the physical origin of the image contrast. A new technique (named Peak Force Tapping) based on the real time force distance curve analysis has been recently introduced to map the nanomechanical properties of materials (such as stiffness, adhesion, deformation, dissipation) simultaneously to the topography, with much higher resolution and less damage.
moreJan. 01, 2008
X. N. Xie and colleagues from the National University of Singapore, presented a patterning method that combines the locality and site specificity of AFM and the surface wave amplification of EHD instability for pattern creation, and is capable of generating a series of structures corresponding to the zeroth- to second-order wave patterns. Detailed simulations in the framework of nonlinear three-dimensional analysis are presented to elucidate the localized EHD pattern formation.