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Bruker Releases Atomic Force Microscope for Patterned Sapphire Substrate Metrology
Aug. 16, 2011

Bruker Releases Atomic Force Microscope for Patterned Sapphire Substrate Metrology

With the Dimension Edge PSS Atomic Force Microscope, Bruker has introduced a production-environment Atomic Force Microscope specifically tailored for patterned sapphire substrate (PSS) metrology in high brightness light-emitting diode (HB-LED) manufacturing. more
Developing MALDI Imaging Technology for Cancer Profile
Nov. 04, 2009

Developing MALDI Imaging Technology for Cancer Profile

Normal and diseased tissues are complex mixtures of different cell populations. A better understanding of protein expression changes that occur during 
diseases needs sensitive and specific technologies for each of these cell types. Mass spectrometry based tissue imaging (MALDI-MSI) is a newly developed technique, allowing the visualization of proteins, peptides, lipids and small molecules directly on thin sections cut from fresh frozen or fixed paraffin embedded tissues. more
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