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Profilometry
True Surface Microscopy
Surface Topography With High Precision: WITec has launched the True Surface Microscopy option. The core element of this imaging mode is an integrated sensor for optical profilometry. Large-area topographic coordinates from the profilometer measurement can be precisely correlated with the large-area confocal Raman imaging data. more
Optical Micro- and Nano- Metrology
To image and measure small structures, forms and surface roughness has become more easy, fast and versatile with the Sensofar PLµ Neox, distributed by the Schaefer-Tec group. The optical profilometers of the PLµ series combine the two complementary measuring techniques of confocal microscopy and interferometry in one and the same instrument. With this, high resolution 3-D imaging and dimensional measurements of nearly all kinds of surfaces are obtained easily and fast. more- Legal
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