Apr. 20, 2012

XFlash 6: Pushing the Limits of Energy Resolution

With XFlash 6, Bruker Nano Analytics has introduced the next generation of silicon drift detectors (SDD) for energy dispersive X-ray spectrometry (EDS) on electron microscopes. moreNov. 06, 2009

Step up to a New Level of Speed

Quantax is a powerful system available for energy dispersive X-ray microanalysis on SEM and electron microprobe. Several system levels and a multitude of options are available for scaling and tuning the system for a wide range of analytical tasks and application environments. Systems of all levels provide state-of-the-art qualitative as well as true standardless quantitative elemental analysis. A standard based Φ(ρ, z) quantification package is optionally available for dedicated analytical tasks. moreOct. 11, 2009

New Software for Feature / Particle Analysis

Bruker AXS Microanalysis introduced Esprit Feature. This new particle analysis software is designed for the companys Quantax EDS analysis systems. Esprit Feature utilizes the Quantax image digitizers and the XFlash EDS Detectors speed for fast, flexible particle identification and chemical classification. Among its powerful image analysis functions are configurable feature detection, a convenient review function as well as chart and report generation. moreJul. 01, 2007

Thomas Schülein opened EDS Microanalysis Colloquium in Berlin

Thomas Schülein opened EDS Microanalysis Colloquium in Berlin: Exciting new insights into EDS microanalysis were delivered at the colloquium "New developments in EDS Analysis at the Scanning Electron Microscope - 4th Generation Liquid Nitrogen Free Silicon Drift Detectors (SDD)" from June 11th to 12th in Berlin Adlershof. Over 120 scientists from Germany, Austria and Switzerland attended the event initiated by Bruker AXS Microanalysis in cooperation with the Federal Institute for Materials Research & Testing (BAM) and the Physikalisch Technische Bundesanstalt (PTB). more