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Sample Preparation

Auriga Laser: FIB-SEM Technology With Laser Option
Mar. 23, 2012

Auriga Laser: FIB-SEM Technology With Laser Option

Carl Zeiss has launched Auriga laser which combines the specific advantages of the Auriga CrossBeam (FIB-SEM) workstation with the capabilities of a pulsed micro-focus laser for fast ablation of material. more
Quorum Technologies Announces Shipment of 500th Q150 Coater
Dec. 14, 2011

Quorum Technologies Announces Shipment of 500th Q150 Coater

Quorum Technologies has announced that their Q150 sputter/carbon coater series for electron microscopy coating applications now numbers more than 500 units worldwide. more
Agar Scientific Adds Precision Membrane Accessories for Electron Microscopy to its Portfolio
Aug. 02, 2011

Agar Scientific Adds Precision Membrane Accessories for Electron Microscopy to its Portfolio

Agar Scientific has added SiMPore precision membranes to its accessories for electron microscopists. more
Newport Introduces Vibration Isolation Baseplate VIBe
May. 17, 2011

Newport Introduces Vibration Isolation Baseplate VIBe

Newport's VIBe, vibration isolation baseplate, is a compact vibration isolation platform that is easy-to-use and requires no air lines, compressors or other accessories to significantly reduce vibrations that can disturb sensitive instruments. more
Introducing the Newport VIBe, Vibration Isolation Baseplate
Apr. 10, 2011

Introducing the Newport VIBe, Vibration Isolation Baseplate

Newport has introduced the VIBe, vibration isolation baseplate, a compact vibration isolation platform that is easy-to-use and requires no air lines, compressors or other accessories to significantly reduce vibrations that can disturb sensitive instruments.
Worry-free and portable, VIBe features a black powder-coated steel plate and patented mechanical isolators that provide both vertical and horizontal vibration isolation. more
XEI Scientific Announces Shipment of 1000th Evactron System
Mar. 17, 2011

XEI Scientific Announces Shipment of 1000th Evactron System

XEI Scientific's has announced that their Evactron Plasma Cleaning System for electron microscopes and other vacuum chambers now numbers more than 1,000 units worldwide.
The Evactron in situ plasma cleaning solution is now seen as the standard for removal of hydrocarbon-based contamination in a large variety of vacuum systems around the world. more
Sample Preparation for SEM, TEM and AFM
Feb. 03, 2011

Sample Preparation for SEM, TEM and AFM

Agar Scientific announce their appointment by Dune Sciences for the supply of SMART Grids to simplify nano- and bioanalysis sample preparation. Applying surface chemistry, SMART Grids characterization substrates capture both biological and nanomaterials through attraction or self-assembly enabling opportunities for integrative analysis and processing. SMART Grids are tools for enhanced analytical characterization and the development of new nanoscale materials. more
XRF Analysis
Jan. 28, 2011

XRF Analysis

Analysing minerals, ceramics and similar samples by XRF, the Vulcan fusion system, distributed in the UK by Analysco, uses automatic fusion control to achieve better sample uniformity and repeatability.
more
Desktop Sample Cleaning System from Hitachi
Dec. 26, 2010

Desktop Sample Cleaning System from Hitachi

Desktop Sample Cleaner from Hitachi: Hitachi High-Technologies has launched the ZONESem desktop EM sample cleaner, specifically designed for cleaning and storing electron microscopy samples in readiness for high quality imaging and analysis. The Hitachi ZONESem utilizes a non-destructive UV cleaning process to quickly remove surface hydrocarbons from SEM samples. more
Extreme Resolution SEM for Life Science
Dec. 10, 2010

Extreme Resolution SEM for Life Science

The Magellan extreme resolution scanning electron microscope (SEM) from FEI Company is optimized specifically for life science imaging. It enables life science researchers and cell biologists to actually view the entire organization of a cell in its natural, fully-hydrated state. Magellan provides high-throughput, sub-nanometer resolution even at low accelerating voltages, while maintaining the flexibility and ease-of-use that are characteristic of SEM technology. more
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