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Scanning Electron Microscopy

RISE Microscopy Chosen as 2015 Prism Award Finalist
Dec. 01, 2014

RISE Microscopy Chosen as 2015 Prism Award Finalist

RISE Microscopy has been nominated for a 2015 Photonics Prism Award. These well-respected product innovation awards honor the best new photonic products on the market and are each year presented by SPIE and Photonics Media at a gala event during Photonics West in San Francisco. RISE microscopy is a correlative microscopy technique combining the chemical analysis power of Raman imaging with the ultra-structural characterization capabilities of a scanning electron microscope in an integrated system.
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Zeiss MultiSEM 505: Revolutionize the Speed of Electron Microscopy
Nov. 04, 2014

Zeiss MultiSEM 505: Revolutionize the Speed of Electron Microscopy

Zeiss will introduce the world's fastest scanning electron microscope (SEM) to an international audience at this year's Neurosience in Washington, D.C. more
Scanning Electron Microscopy: Increasing Resolution in Low-Energy Region
Sep. 29, 2014

Scanning Electron Microscopy: Increasing Resolution in Low-Energy Region

The scanning electron microscope is not only used for precisely surveying the surface topology of samples, but also for determining their chemical compositions. This is done by exciting the atoms to fluoresce under irradiation by an electron beam while scanning the sample. This secondary emission provides information about the location and type of element, insofar as the analysis is sufficiently precise. However, the lighter elements of the periodic table such as lithium, beryllium, boron, carbon, and nitrogen emit secondary fluorescence in an energy range that cannot be sufficiently well resolved by energy dispersive spectrometers (EDS).
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Correlative Tabletop Fluorescence and Electron Microscope
Sep. 16, 2014

Correlative Tabletop Fluorescence and Electron Microscope

Delmic and Phenom World announce DelPhi, the world's first integrated tabletop fluorescence and electron microscope. Delmic produces high performance, user friendly, integrated solutions while Phenom World is a leading producer of electron microscopes. The DelPhi is a complete solution that makes it possible to do fast correlative microscopy with high overlay precision. The system is easy to use for both optical and electron microscopists and makes correlation intuitive and fully automated. more
SEM of Biological Samples without Coating
May. 05, 2014

SEM of Biological Samples without Coating

Biological SEM samples usually require a metal coating to avoid charging [1]. However, a good knowledge of the properties and behavior of the samples offers ways to utilize internal electrical conductivity of biological samples for Scanning Electron MIcroscopy (SEM) examination without the need for metal coating. This not only simplifies the preparation, viewing and imaging. It also opens up new ways to examine natural, uncoated surfaces, for example compositional contrast imaging or for the study of adhesion effects. more
WITec and Tescan Introduce RISE Microscopy
Mar. 28, 2014

WITec and Tescan Introduce RISE Microscopy

WITec and Tescan have introduced RISE Microscopy, a correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. more
RISE Microscopy
Mar. 27, 2014

RISE Microscopy

RISE Microscopy is a novel correlative microscopy technique that combines Scanning Electron Microscopy (SEM) and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
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Scanning Electron Microscopy: 3D SEM Metrology for 10 nm Structures
Mar. 25, 2014

Scanning Electron Microscopy: 3D SEM Metrology for 10 nm Structures

PML researchers have devised an idea for determining the three-dimensional shape of features as small as 10 nanometers wide. The model-based method compares data from scanning electron microscope (SEM) images with stored entries in a library of three dimensional (3D) shapes to find a match and to determine the shape of the sample. The work provides a powerful new way to characterize nanostructures.
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Scanning Electron Microscopy: Getting Rid of Bad Vibrations
Mar. 20, 2014

Scanning Electron Microscopy: Getting Rid of Bad Vibrations

Scanning electron microscopes are extremely sensitive and even subtle movements going on around them can affect their accuracy. Vibration control tables already exist to dampen these sometimes barely perceptible disturbances. But now a new kind of isolation platform for the first time integrates sensors and actuators into the mount - resulting in a platform that is more cost-effective and compact than its predecessors. Its designers will be showcasing this new form of isolation at the Hannover Messe (Hall 2, Booth D13) from April 7-11. more
Messengers from Space
Oct. 10, 2013

Messengers from Space

The macro- and microstructure of iron meteorites provide valuable insights into both the inner structure of our planet and the history of our solar system. High speed collision events in the asteroid belt send the meteorites careening toward Earth. The collisions produce unique deformation microstructures. With cooling rates on the scale of a few degrees per million years, iron meteorites can consist of crystal sizes on the order of meters prior to the collision events. These extremely slow cooling rates result in phase transformations occurring at conditions near thermodynamic equilibrium. Preserving meteorite fragments is important for future studies of phase transformations, material behavior at high strain rates, and the origin of the universe.
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