You are here: Home

Scanning Electron Microscopy

Feb. 19, 2015

RISE Microscope Wins Prism Award 2015

WITec and Tescan have been recognized with a 2015 Photonics Prism Award. An expert jury named the correlative RISE microscope as winner in the metrology category. The Prism Award is given for top innovations in the field of photonics, granted by Photonics Media and sponsored by the international Society for Optics and Photonics (SPIE.). The winners were chosen from more than 130 applicants.
more
Automated Geometric SEM Calibration
Jan. 19, 2015

Automated Geometric SEM Calibration

A new calibration approach allows a fast and easy-to-handle geometric calibration of Scanning Electron Microscopy (SEM). This article outlines the application of 3D calibration standards with spatially distributed circular reference markers. The underlying marker-based calibration concept determines scale and shear factors of the coordinate axes and facilitates the analysis of image distortions and other remaining image errors. We present the application of 3D calibration standards, both for 2D and for 3D measurements, and show its contribution to achieving a higher measurement accuracy. more
Jan. 12, 2015

RISE Microscopy: Winner of The Analytical Scientist Innovation Awards 2014

The Analytical Scientist Innovation Awards (TASIAs) recognize top innovations in the field of analytical chemistry. A jury of three independent experts and The Analytical Scientist editorial team chose the Raman Imaging and Scanning Electron (RISE) Microscope from the German microscope manufacturer WITec as the second 2014 TASIA winner.
more
RISE Microscopy Chosen as 2015 Prism Award Finalist
Dec. 01, 2014

RISE Microscopy Chosen as 2015 Prism Award Finalist

RISE Microscopy has been nominated for a 2015 Photonics Prism Award. These well-respected product innovation awards honor the best new photonic products on the market and are each year presented by SPIE and Photonics Media at a gala event during Photonics West in San Francisco. RISE microscopy is a correlative microscopy technique combining the chemical analysis power of Raman imaging with the ultra-structural characterization capabilities of a scanning electron microscope in an integrated system.
more
Zeiss MultiSEM 505: Revolutionize the Speed of Electron Microscopy
Nov. 04, 2014

Zeiss MultiSEM 505: Revolutionize the Speed of Electron Microscopy

Zeiss will introduce the world's fastest scanning electron microscope (SEM) to an international audience at this year's Neurosience in Washington, D.C. more
Scanning Electron Microscopy: Increasing Resolution in Low-Energy Region
Sep. 29, 2014

Scanning Electron Microscopy: Increasing Resolution in Low-Energy Region

The scanning electron microscope is not only used for precisely surveying the surface topology of samples, but also for determining their chemical compositions. This is done by exciting the atoms to fluoresce under irradiation by an electron beam while scanning the sample. This secondary emission provides information about the location and type of element, insofar as the analysis is sufficiently precise. However, the lighter elements of the periodic table such as lithium, beryllium, boron, carbon, and nitrogen emit secondary fluorescence in an energy range that cannot be sufficiently well resolved by energy dispersive spectrometers (EDS).
more
Correlative Tabletop Fluorescence and Electron Microscope
Sep. 16, 2014

Correlative Tabletop Fluorescence and Electron Microscope

Delmic and Phenom World announce DelPhi, the world's first integrated tabletop fluorescence and electron microscope. Delmic produces high performance, user friendly, integrated solutions while Phenom World is a leading producer of electron microscopes. The DelPhi is a complete solution that makes it possible to do fast correlative microscopy with high overlay precision. The system is easy to use for both optical and electron microscopists and makes correlation intuitive and fully automated. more
SEM of Biological Samples without Coating
May. 05, 2014

SEM of Biological Samples without Coating

Biological SEM samples usually require a metal coating to avoid charging [1]. However, a good knowledge of the properties and behavior of the samples offers ways to utilize internal electrical conductivity of biological samples for Scanning Electron MIcroscopy (SEM) examination without the need for metal coating. This not only simplifies the preparation, viewing and imaging. It also opens up new ways to examine natural, uncoated surfaces, for example compositional contrast imaging or for the study of adhesion effects. more
WITec and Tescan Introduce RISE Microscopy
Mar. 28, 2014

WITec and Tescan Introduce RISE Microscopy

WITec and Tescan have introduced RISE Microscopy, a correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. more
RISE Microscopy
Mar. 27, 2014

RISE Microscopy

RISE Microscopy is a novel correlative microscopy technique that combines Scanning Electron Microscopy (SEM) and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
more
RSS Newsletter