Nov. 04, 2014
Zeiss will introduce the world's fastest scanning electron microscope (SEM) to an international audience at this year's Neurosience in Washington, D.C.
moreSep. 29, 2014
The scanning electron microscope is not only used for precisely surveying the surface topology of samples, but also for determining their chemical compositions. This is done by exciting the atoms to fluoresce under irradiation by an electron beam while scanning the sample. This secondary emission provides information about the location and type of element, insofar as the analysis is sufficiently precise. However, the lighter elements of the periodic table such as lithium, beryllium, boron, carbon, and nitrogen emit secondary fluorescence in an energy range that cannot be sufficiently well resolved by energy dispersive spectrometers (EDS).
moreSep. 16, 2014
Delmic and Phenom World announce DelPhi, the world's first integrated tabletop fluorescence and electron microscope. Delmic produces high performance, user friendly, integrated solutions while Phenom World is a leading producer of electron microscopes. The DelPhi is a complete solution that makes it possible to do fast correlative microscopy with high overlay precision. The system is easy to use for both optical and electron microscopists and makes correlation intuitive and fully automated.
moreMay. 05, 2014
Biological SEM samples usually require a metal coating to avoid charging . However, a good knowledge of the properties and behavior of the samples offers ways to utilize internal electrical conductivity of biological samples for Scanning Electron MIcroscopy (SEM) examination without the need for metal coating. This not only simplifies the preparation, viewing and imaging. It also opens up new ways to examine natural, uncoated surfaces, for example compositional contrast imaging or for the study of adhesion effects.
moreMar. 28, 2014
WITec and Tescan have introduced RISE Microscopy, a correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system.
moreMar. 27, 2014
RISE Microscopy is a novel correlative microscopy technique that combines Scanning Electron Microscopy (SEM) and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
moreMar. 25, 2014
PML researchers have devised an idea for determining the three-dimensional shape of features as small as 10 nanometers wide. The model-based method compares data from scanning electron microscope (SEM) images with stored entries in a library of three dimensional (3D) shapes to find a match and to determine the shape of the sample. The work provides a powerful new way to characterize nanostructures.
moreMar. 20, 2014
Scanning electron microscopes are extremely sensitive and even subtle movements going on around them can affect their accuracy. Vibration control tables already exist to dampen these sometimes barely perceptible disturbances. But now a new kind of isolation platform for the first time integrates sensors and actuators into the mount - resulting in a platform that is more cost-effective and compact than its predecessors. Its designers will be showcasing this new form of isolation at the Hannover Messe (Hall 2, Booth D13) from April 7-11.
moreOct. 10, 2013
The macro- and microstructure of iron meteorites provide valuable insights into both the inner structure of our planet and the history of our solar system. High speed collision events in the asteroid belt send the meteorites careening toward Earth. The collisions produce unique deformation microstructures. With cooling rates on the scale of a few degrees per million years, iron meteorites can consist of crystal sizes on the order of meters prior to the collision events. These extremely slow cooling rates result in phase transformations occurring at conditions near thermodynamic equilibrium. Preserving meteorite fragments is important for future studies of phase transformations, material behavior at high strain rates, and the origin of the universe.
moreSep. 24, 2013
Carl Zeiss Microscopy has introduced its crossbeam series Gemini I VP (variable pressure) and Gemini II for fast materials processing and high resolution imaging.