Apr. 20, 2012

XFlash 6: Pushing the Limits of Energy Resolution

With XFlash 6, Bruker Nano Analytics has introduced the next generation of silicon drift detectors (SDD) for energy dispersive X-ray spectrometry (EDS) on electron microscopes. moreApr. 17, 2012

FIB-SEM with Laser Option

Scanning Electron Microscopy (SEM) has become a valuable tool for two- and three-dimensional characterization of micro- and nano-scale samples. A wide range of industry applications stand to benefit from this technology, e.g., materials research, development of pharmaceutical products, and process development in semiconductor or photovoltaic manufacturing. What they have in common: a specific region of a specimen has to be analyzed. moreMar. 29, 2012

Analyzing Biomaterials by Nanofocus Computed Tomography

3D biomaterials are known to function as alternative bone grafts. In the area of Tissue Engineering (TE) 3D matrices are often used in combination with mesenchymal stem cells to build up a functional tissue graft. In this approach the selection of a matrix is a crucial factor. For bone TE applications the matrix should fulfill the following geometrical properties. moreFeb. 28, 2012

Nanosized Films of Fe2O3

We have investigated nanosized thin films of α-Fe2O3 (hematite) with addition of Lithium, by the impedance spectroscopy (IS), scanning electron microscopy (SEM), and X-ray diffraction (XRD). moreJan. 23, 2012

Tescan Introduces an Integrated Mineral Analyzer (TIMA)

Tescan has introduced the Tescan Integrated Mineral Analyzer (TIMA). TIMA, a fully automated, high throughput, analytical scanning electron microscope, is designed specifically for the mining and minerals processing industry. moreJan. 10, 2012

FEI Acquires ASPEX

FEI, an  instrumentation company providing imaging and analysis systems for research and industry, announced that it has acquired ASPEX Corporation of Delmont, PA. ASPEX provides rugged scanning electron microscopes (SEMs) and related services for environmentally demanding military, industrial and factory floor applications.
moreNov. 14, 2011

Ni-Nanostructures Within Porous Silicon

A semiconducting/ferromagnetic nanocomposite, consisting of a porosified silicon wafer and deposited Ni-nanostructures, is presented. Porous silicon matrices achieved by anodization of a highly n doped wafer offer oriented pores with an average pore-diameter of 80 nm. Within these pores Ni-nanostructures are deposited resulting in a ferromagnetic system with specific magnetic properties. SEM and TEM investigations are performed to get a correlation between morphology and magnetic behavior.

Introduction
moreSep. 19, 2011

VM12 Strengthing by Precipitates - TEM Study of Precipitates in the Martensitic VM12 Steel

Martensitic VM12 steel was recently developed for advanced coal-fired power stations. Its creep resistance is dependent on a stability of microstructure. Destabilization of microstructure is caused by recovery and softening processes of a tempered martensite and depends on changes of a dislocation substructure and morphology of secondary particles during creep. Quantitative TEM analyses of VM12 steel were ­undertaken to determine the microstructure parameters after creep at 625°C up to 30.000h.

Experimental
moreSep. 05, 2011

Phase Growth in Wire Bond Interconnects - Microstructural Characterization by EBSD

Gold wire bonding on aluminium pads plays an important role in microelectronic packaging. The reliability and lifetime of the interconnection is determined by intermetallic phases formed at the Au/Al interface. Five phases are stable at room temperature. Some of them are supposed to undergo degradation pro­cesses due to mechanical stress or chemical reactions during IC lifetime. For microstructural characterization, investigations by EBSD are applied as an alternative to expensive TEM analyses.

Introduction
moreAug. 18, 2011

Body Architecture of the Parasitic Worm

Diplozoid monogenean Eudiplozoon nipponicum, with complex life cycle comprising oncomiracidium, diporpa, juvenile and adult stage, represents an ideal model for studies on morphological adaptations of metazoan parasites to the ectoparasitic life style. Combined morphological approach offers the advantage of more complex characterization and visualization of structures noticeable only when using specific microscopic method.

Crucial Questions to be Answered when Performing Scientific Research
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