Dec. 09, 2010

Ultra-low Temperature Scanning Probe Microscope

The discoveries of superconductivity, the quantum Hall effect and the fractional quantum Hall effect were all the result of measurements made at increasingly lower temperatures. Now, pushing the regime of the very cold into the very small, a research team from the National Institute of Standards and Technology (NIST), the University of Maryland, Janis Research Company, Inc., and Seoul National University, has designed and built the most advanced ultra-low temperature scanning probe microscope (ULTSPM) in the world. moreApr. 12, 2010

Accelerating the Scanning Probe Microscope

Since more than twenty years, scanning force microscopes are employed in research and industry. Their enormous resolution triggered many applications in nanotechnology. Their rather low image rate is however a disadvantage - changing objects and processes cannot be imaged. Physicists of Saarland University, Germany have developed a technology that could accelerate scanning probe microscopes by a factor of 1000. The operation principle is explained from April 17th to 24th on the Saarland Forschungsstand on the Hannover Messe (Hall 2, Booth C 44). moreFeb. 23, 2010

Asylum Research Extends Distribution in Latin America

Asylum Research and Micra Nanotecnologia announced that they have entered into a new distribution agreement that will enable Asylum to extend its global reach and promote its products in Latin America. Based in Mexico City, Micra Nanotecnologia, is the most experienced microscopy distributor in Latin America, with over two decades specializing in providing atomic force microscopes and other microscopy instrumentation. They will sell, install, and support Asylum's complete line of scanning probe/atomic force microscopes, including the Cypher AFM and the MFP-3D Family of AFMs. moreNov. 01, 2009

Scanning Probe Microscope Control

Controlling the latest Scanning Probe Microscopes (SPMs) demand highly sophisticated electronics. This is apparent when considering even relatively simple operational procedures such as the tip approach of an Atomic Force Microscope (AFM): The controller must lower the tip towards the sample surface while at the same time it must ensure that the tip does not crash into the sample. moreNov. 01, 2007

High-resolution Microscope for Tipenhanced Optical Processes in UHV

High-resolution Microscope for Tipenhanced Optical Processes in UHV. J. Steidtner & B. Pettinger in Berlin, Germany present an optical microscope based on tip-enhanced optical processes that can be used for studies on adsorbates as well as thin layers and nanostructures. It provides chemical and topographic informations with a resolution of a few nanometers and can be employed in ultrahigh vacuum as well as gas phase. moreMar. 01, 2005

85th Olympus Technology Fair: Digital imaging, Tissue Engineering - Capsule Endoscope, Scanning ...

85th Olympus Technology Fair: Digital imaging, Tissue Engineering - Capsule Endoscope, Scanning Probe Microscope
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