Nov. 03, 2011

Variable Field Module for Magnetic Atomic Force Microscopy Experiments

Asylum Research has launched the Variable Field Module2 (VFM2) for magnetic atomic force microscopy applications with MFP-3D Atomic Force Microscopes (AFM). moreOct. 19, 2011

Daniel Guntli as New COO at NanoWorld

Daniel Guntli, formerly the Assistant General Management, has joined NanoWorld's management team as the new Chief Operating Officer.

"Dr Guntli is ideally positioned to take over the responsibility for our operations. He joined NanoWorld over three years ago and gained in-depth knowledge of NanoWorld's global operational processes and has a track record of successful project management and leadership," said NanoWorld CEO Manfred Detterbeck.
moreOct. 18, 2011

Applications of Scanning Probe Microscopy and Optical Tweezers

JPK Instruments recently hosted their 10th annual international symposium on the applications of scanning probe microscopy (SPM) and optical tweezers. Held this month in the historic Umspannwerk Ost in Berlin, Germany the meeting brought together more than 100 scientists from around the world. The combination of papers and posters inspired excellent discussions as attendees presented their results and shared scientific know how in a relaxed and informal atmosphere. moreOct. 07, 2011

Poster Award in the Field of Scanning Probe Microscopy

The Scanning Probe Microscopy and Optical Tweezers communities are meeting this week at the 10th International Symposium on Scanning Probe Microscopy & Optical Tweezers in Life Sciences in Berlin, Germany to present and discuss their recent results.

The winners of the poster award in the field of Scanning Probe Microscopy are:

1st Place: Huong Nguyen, Max Planck Institute for Polymer Research, Johannes Gutenberg University Mainz, Institute of Pharmacy and Biochemistry, Mainz moreJun. 10, 2011

Extended DNA Dynamics Experiments by Applying Atomic Force Microscopy –

JPK Instruments has reported on the work from the Pharmaceutical Sciences Department of the Medical School at the University of Nebraska. The Department has selected the JPK ForceRobot 300 system to extend their studies applying atomic force microscopy in the measurement of single molecule force spectroscopy. moreJun. 08, 2011

Scanning Probe Microscopy with Cold-atom Quantum Tip

The heart of a scanning probe microscope is a moveable, suspended tip, which, like the needle on a record player, reacts to small height variations on the surface, and turns these into signals that can be displayed on a computer.
moreJun. 02, 2011

Surface Imaging and Metrology Software from Digital Surf

Digital Surf has announced the release of MountainsMap 6.1, the latest version of its MountainsMap surface imaging and analysis software for all types of surface metrology instrument including confocal microscopes, white light interferometers, scanning probe microscopes, and contact and non-contact profilometers. moreMay. 31, 2011

Website for High Speed Scanning Atomic Force Microscopy

NanoWorld has introduced a website entirely dedicated to High Speed Scanning Atomic Force Microscopy (HS-AFM). moreMay. 04, 2011

JPK Instruments introduces NanoWizard 3 BioScience AFM

Torsten Jähnke, CTO from JPK Instruments highlights NanoWizard 3 BioScience AFM. The system is designed for optimal use in liquid for applications ranging from single molecules to living cells.
www.jpk.com moreMar. 22, 2011

Pittcon 2011: the Editors Gold Award Goes to WITec

The Editors Choice Awards honors the most significant and important technological advancement introduced at the Pittcon conference and technical exhibition (14.-17.March 2011, Atlanta, USA). This year 27 different products were nominated by a panel of more than 150 editors. more