Jan. 11, 2012

Park Systems NX10: Research-Grade True Non-Contact Atomic Force Microscope

Schaefer Technology has introduced the Park Systems NX10, a very accurate Atomic Force Microscope (AFM) which brings high imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price. moreFeb. 23, 2011

Schaefer-Tec Distributes Low-Cost Multimode High-Resolution AFM

Schaefer-Tec now distributes a multimode and high resolution AFM including PC and LabView based software for a price below 25.000 Euro. The TT-AFM is supplied with all mechanical and electrical drawings and the LabView based software can be user modified. The system is therefore very well suited for researchers or engineers who would like to make their own modifications to the AFM as well as for teaching purposes.
The TT-AFM is also available as a self-build kit for a price below 20.000 Euro moreJul. 24, 2010

AppNano AFM Cantilevers

The Schaefer-Tec group has signed a distribution contract with the company Applied NanoStructures Inc. for the distribution of the AppNano cantilevers in Europe. The AFM cantilevers are now available from all Schaefer offices. A wide variety of silicon AFM cantilevers for Contact Mode, Non-Contact/Tapping Mode, Force Modulation, Super Sharp, Silicon Nitride, MFM, Electrical Conductivity, High Aspect Ratio as well as Tipless Cantilevers are being produced. Due to the alignment structure the AppNano cantilevers are very well suited for the Nanosurf AFM's but also for all other AFM brands. moreMar. 10, 2010

Optical Micro- and Nano- Metrology

To image and measure small structures, forms and surface roughness has become more easy, fast and versatile with the Sensofar PLµ Neox, distributed by the Schaefer-Tec group. The optical profilometers of the PLµ series combine the two complementary measuring techniques of confocal microscopy and interferometry in one and the same instrument. With this, high resolution 3-D imaging and dimensional measurements of nearly all kinds of surfaces are obtained easily and fast. moreNov. 14, 2009

Confocal and Interferometer Profiler in one

Schaefer-Tec launched the new Sensofar PLµ NEOX optical profiler that combines the complementary measuring methods confocal and interferometry in one instrument. The integrated piezo scanner provides a vertical resolution of down to 0.01nm in the Phaseshifting Interferometry mode while the linear stage allows for up to 40 mm vertical scanrange. Sensofars patented microdisplay-based confocal scanning technology works without moving parts and guarantees a very long lifetime without maintenance. more