Mar. 21, 2011

Jeol Introduces Multi-Touch Screen Interface for Scanning Electron Microscopy

Jeol has announced that they now offer InTouch Scope, an analytical, low vacuum Scanning Electron Microscope (SEM) with integrated EDS analysis and multi-touch screen functionality. moreFeb. 21, 2011

X-Max EDS-Detector from Oxford Instruments: 1000th was installed

Oxford Instruments has completed the installation of its 1000th X-Max:
X-Max was introduced to the market over two years ago and was the world's first "Large Area" silicon drift detector with an effective sensor area of 80mm2. The installation of the 1000th X-Max took place at Atotech in Berlin, Germany. moreDec. 23, 2009

Apollo SDD Series for EDS Analysis

EDAX has introduced the next series of Apollo SDD detectors for X-ray microanalysis. "While the Apollo Series offers a range of detector sizes and performance levels including a large-area SDD chip," notes Judy O'Loughlin, Director of Product Marketing for EDAX, "it emphasizes a more important feature, the positioning of the detectors close to the sample, making it comparable to the best-designed Si(Li) detectors. EDAX's Apollo Series offers users the best of both worlds. All SDDs are able to map at high resolution, and all SDDs can map at high count rates. more