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WITec and Tescan Introduce RISE Microscopy
Mar. 28, 2014

WITec and Tescan Introduce RISE Microscopy

WITec and Tescan have introduced RISE Microscopy, a correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system. more
RISE Microscopy
Mar. 27, 2014

RISE Microscopy

RISE Microscopy is a novel correlative microscopy technique that combines Scanning Electron Microscopy (SEM) and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
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Scanning Electron Microscopy: 3D SEM Metrology for 10 nm Structures
Mar. 25, 2014

Scanning Electron Microscopy: 3D SEM Metrology for 10 nm Structures

PML researchers have devised an idea for determining the three-dimensional shape of features as small as 10 nanometers wide. The model-based method compares data from scanning electron microscope (SEM) images with stored entries in a library of three dimensional (3D) shapes to find a match and to determine the shape of the sample. The work provides a powerful new way to characterize nanostructures.
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Messengers from Space
Oct. 10, 2013

Messengers from Space

The macro- and microstructure of iron meteorites provide valuable insights into both the inner structure of our planet and the history of our solar system. High speed collision events in the asteroid belt send the meteorites careening toward Earth. The collisions produce unique deformation microstructures. With cooling rates on the scale of a few degrees per million years, iron meteorites can consist of crystal sizes on the order of meters prior to the collision events. These extremely slow cooling rates result in phase transformations occurring at conditions near thermodynamic equilibrium. Preserving meteorite fragments is important for future studies of phase transformations, material behavior at high strain rates, and the origin of the universe.
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Carl Zeiss Microscopy Introduces FIB-SEM System for 3D Nanotomography and Nanofabrication
Sep. 24, 2013

Carl Zeiss Microscopy Introduces FIB-SEM System for 3D Nanotomography and Nanofabrication

Carl Zeiss Microscopy has introduced its crossbeam series Gemini I VP (variable pressure) and Gemini II for fast materials processing and high resolution imaging. more
Nanoflight SEM Movies
Aug. 30, 2013

Nanoflight SEM Movies

The scientific community and with it, every researcher, should be committed to sharing the aesthetics of the microworld, with as many people as possible. In the past it was mostly still shots of the specimen that were available. We thought it would be worth it to bring movement, color and lighting effects into the microworld and so developed a modular software called "nanoflight.creator" [1] with the goal of taking control of parameters like specimen movement, detector values, focus and colors of each detector channel in the Scanning Electron Microscope (SEM).
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Quantum-assisted Nano-imaging of Living Organism
May. 06, 2013

Quantum-assisted Nano-imaging of Living Organism

In science, many of the most interesting events occur at a scale far smaller than the unaided human eye can see. Medical researchers might realize a range of breakthroughs if they could look deep inside living biological cells, but existing methods for imaging either lack the desired sensitivity and resolution or require conditions that lead to cell death, such as cryogenic temperatures. Recently, however, a team of Harvard University-led researchers working on DARPA's Quantum-Assisted Sensing and Readout (QuASAR) program demonstrated imaging of magnetic structures inside of living cells. Using equipment operated at room temperature and pressure, the team was able to display detail down to 400 nanometers, which is roughly the size of two measles viruses.
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University College London Uses Evactron Plasma Technology
Apr. 22, 2013

University College London Uses Evactron Plasma Technology

XEI Scientific Inc. has reported that the University College London (UCL) is using an Evactron plasma technology for cleaning their scanning electron microscopy chamber. more
Scanning Electron Microscopy: Avoiding Contaminations by Improving Cleaning Techniques
Mar. 19, 2013

Scanning Electron Microscopy: Avoiding Contaminations by Improving Cleaning Techniques

Since the inception of the scanning electron microscope (SEM), users have encountered the persistent problem of contamination. Cleanliness is required for imaging and to make good quality measurements, and Physical Measurement Laboratory (PML) has led the exploration and the development of methods to allow SEM users gather high-quality, repeatable, and quantitative measurement results.
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SEM and ESEM Observation of Stem Cells
Feb. 25, 2013

SEM and ESEM Observation of Stem Cells

Studying biological samples with scanning electron microscopy has specific requirements for their preparation. Sample drying is a particularly critical operation for objects such as cultured cells. The requirement for damaging drying step can be eliminated using environmental scanning electron microscopy. This study compares dried and wet samples of cultured human embryonic stem cells. It points to the advantages of both methods and to the complementarity of the information that they provide.
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