Jan. 19, 2015
A new calibration approach allows a fast and easy-to-handle geometric calibration of Scanning Electron Microscopy (SEM). This article outlines the application of 3D calibration standards with spatially distributed circular reference markers. The underlying marker-based calibration concept determines scale and shear factors of the coordinate axes and facilitates the analysis of image distortions and other remaining image errors. We present the application of 3D calibration standards, both for 2D and for 3D measurements, and show its contribution to achieving a higher measurement accuracy.
moreNov. 04, 2014
Zeiss will introduce the world's fastest scanning electron microscope (SEM) to an international audience at this year's Neurosience in Washington, D.C.
moreOct. 07, 2014
The conference "Microscopy of Semiconducting Materials" will take place from March 29 - April 2, 2015 at the Murray Edwards College in Cambridge, UK. This bi-annual conference series has a long tradition in focusing on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy.
moreMay. 16, 2014
Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, scanning electron microscopes (SEMs) simply can't see materials that don't conduct electricity very well, and their high energies can actually damage some types of samples. In an effort to extract a little more truth from the world of nanomaterials and nanostructures, researchers at the National Institute of Standards and Technology (NIST) have built the first low-energy focused ion beam (FIB) microscope that uses a lithium ion source.
moreMar. 28, 2014
WITec and Tescan have introduced RISE Microscopy, a correlative microscopy technique which combines confocal Raman Imaging and Scanning Electron (RISE) Microscopy within one integrated microscope system.
moreMar. 27, 2014
RISE Microscopy is a novel correlative microscopy technique that combines Scanning Electron Microscopy (SEM) and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.
moreMar. 25, 2014
PML researchers have devised an idea for determining the three-dimensional shape of features as small as 10 nanometers wide. The model-based method compares data from scanning electron microscope (SEM) images with stored entries in a library of three dimensional (3D) shapes to find a match and to determine the shape of the sample. The work provides a powerful new way to characterize nanostructures.
moreOct. 10, 2013
The macro- and microstructure of iron meteorites provide valuable insights into both the inner structure of our planet and the history of our solar system. High speed collision events in the asteroid belt send the meteorites careening toward Earth. The collisions produce unique deformation microstructures. With cooling rates on the scale of a few degrees per million years, iron meteorites can consist of crystal sizes on the order of meters prior to the collision events. These extremely slow cooling rates result in phase transformations occurring at conditions near thermodynamic equilibrium. Preserving meteorite fragments is important for future studies of phase transformations, material behavior at high strain rates, and the origin of the universe.
moreSep. 24, 2013
Carl Zeiss Microscopy has introduced its crossbeam series Gemini I VP (variable pressure) and Gemini II for fast materials processing and high resolution imaging.
moreAug. 30, 2013
The scientific community and with it, every researcher, should be committed to sharing the aesthetics of the microworld, with as many people as possible. In the past it was mostly still shots of the specimen that were available. We thought it would be worth it to bring movement, color and lighting effects into the microworld and so developed a modular software called "nanoflight.creator"  with the goal of taking control of parameters like specimen movement, detector values, focus and colors of each detector channel in the Scanning Electron Microscope (SEM).