Mar. 03, 2016Applications
TEM and SEM measurements are commonly used methods for characterization of nanomaterials. Typically a single sample is applied onto an EM specimen holder or grid. Due to the fact that these grids have to be moved inside a vacuum chamber, ...
Feb. 29, 2016Science
The system contains a quadruple ionization detector of backscattered electrons placed in a hole of the objective lens and a pressure limiting aperture extension serving alternatively as an ionization secondary electron detector or the ...
Jan. 25, 2016Products
Digital Surf has introduced Mountains 7.3 software, including a feature for Scanning Electron Microscopy image colorization.
Dec. 22, 2015Products
Zeiss has introduced it´s MultiSEM 506 which features 91 beams working in parallel and increases the throughput of the Zeiss MultiSEM 505 by a factor of three.
Nov. 10, 2015Products
Jeol's benchtop SEM makes it possible to bring basic high-resolution imaging and the analysis features of a full-sized Scanning Electron Microscope into the lab. It fits into small spaces, and its simple operation and versatile ...
Nov. 06, 2015Products
Micro to Nano has introduced a comprehensive range of EM-Tec SEM sample holders. The EM-Tec SEM sample holders increase SEM productivity, avoid contamination issues and use no adhesives.
Sep. 29, 2015Science
Description-rendered micro-CT scan of a polychaete worm parasitized by a copepod parasite, this specimen was prepared using the method described here.
Aug. 04, 2015Science
In the last years SEM & FIB equipment with analytical add-ons has followed a trend of complex integration. Instead of having several instruments each requiring space and environment, customers now desire highly integrated systems with ...
Mar. 24, 2015Science
Microscopy represents a fundamental method for cultural heritage materials research and it is essential for paintings cross-sections investigation. Because of the smallness of sample, microscopy and micro-spectroscopy analysis techniques ...
Jan. 19, 2015Science
A new calibration approach allows a fast and easy-to-handle geometric calibration of Scanning Electron Microscopy (SEM). This article outlines the application of 3D calibration standards with spatially distributed circular reference ...
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