Aug. 03, 2016Products
Tescan is a multi-national company and a leading global developer and supplier of scanning electron microscopes (SEMs), focused ion beam scanning electron microscope (FIB-SEM) systems, unique solutions for SEM and FIB-SEM ...
The CHIPSCANNER from Raith uniquely combines high-resolution electron optics, multiple, highly efficient electron detectors and most precise Laser interferometer Stage technology.
Building off of 50 years of SEM innovation is JEOL’s JSM-IT100 series SEM. Ease of use is a key feature of our InTouchScopeTM series while still maintaining the versatility and expandability expected from a research grade SEM.
Aug. 02, 2016Products
Deben’s STEM detector is configured with a four element dark field diode wired to give two independent channels and a single bright field channel. A motorised retractable arm allows mounting on any SEM with a free chamber port. The ...
Mar. 03, 2016Applications
TEM and SEM measurements are commonly used methods for characterization of nanomaterials. Typically a single sample is applied onto an EM specimen holder or grid. Due to the fact that these grids have to be moved inside a vacuum chamber, ...
Feb. 29, 2016Science
The system contains a quadruple ionization detector of backscattered electrons placed in a hole of the objective lens and a pressure limiting aperture extension serving alternatively as an ionization secondary electron detector or the ...
Feb. 15, 2016Products
Micro to Nano reveals its complete range of innovative SEM calibration standards:
1 - Advanced EM-Tec MCS-1 and MCS-0.1 with calibration features from 2.5mm to 1µm or 2.5mm to 100nm to cover the complete magnification range.
2 - U ...
Jan. 25, 2016Products
Digital Surf has introduced Mountains 7.3 software, including a feature for Scanning Electron Microscopy image colorization.
Dec. 22, 2015Products
Zeiss has introduced it´s MultiSEM 506 which features 91 beams working in parallel and increases the throughput of the Zeiss MultiSEM 505 by a factor of three.
Nov. 10, 2015Products
Jeol's benchtop SEM makes it possible to bring basic high-resolution imaging and the analysis features of a full-sized Scanning Electron Microscope into the lab. It fits into small spaces, and its simple operation and versatile ...
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