Jan. 10, 2012

FEI Acquires ASPEX

FEI, an  instrumentation company providing imaging and analysis systems for research and industry, announced that it has acquired ASPEX Corporation of Delmont, PA. ASPEX provides rugged scanning electron microscopes (SEMs) and related services for environmentally demanding military, industrial and factory floor applications.
moreDec. 06, 2011

FEI Launches MAPS Software for Cellular Biology Research

FEI has launched the MAPS (Modular Automated Processing System) software which combines the advantages of both light and electron microscopy for cellular biology research. moreNov. 14, 2011

Ni-Nanostructures Within Porous Silicon

A semiconducting/ferromagnetic nanocomposite, consisting of a porosified silicon wafer and deposited Ni-nanostructures, is presented. Porous silicon matrices achieved by anodization of a highly n doped wafer offer oriented pores with an average pore-diameter of 80 nm. Within these pores Ni-nanostructures are deposited resulting in a ferromagnetic system with specific magnetic properties. SEM and TEM investigations are performed to get a correlation between morphology and magnetic behavior.

Introduction
moreSep. 19, 2011

VM12 Strengthing by Precipitates - TEM Study of Precipitates in the Martensitic VM12 Steel

Martensitic VM12 steel was recently developed for advanced coal-fired power stations. Its creep resistance is dependent on a stability of microstructure. Destabilization of microstructure is caused by recovery and softening processes of a tempered martensite and depends on changes of a dislocation substructure and morphology of secondary particles during creep. Quantitative TEM analyses of VM12 steel were ­undertaken to determine the microstructure parameters after creep at 625°C up to 30.000h.

Experimental
moreAug. 18, 2011

Body Architecture of the Parasitic Worm

Diplozoid monogenean Eudiplozoon nipponicum, with complex life cycle comprising oncomiracidium, diporpa, juvenile and adult stage, represents an ideal model for studies on morphological adaptations of metazoan parasites to the ectoparasitic life style. Combined morphological approach offers the advantage of more complex characterization and visualization of structures noticeable only when using specific microscopic method.

Crucial Questions to be Answered when Performing Scientific Research
moreAug. 17, 2011

The National Institute of Materials Physics Gets High-Tech Devices for Material Analysis

The National Institute of Materials Physics (NIMP) in Magurele near Bucharest, Romania were equipped with apparatus for complex examination and characterization of the microstructure of materials. moreAug. 08, 2011

3D Elemental Mapping in the ESEM - A Combination of Serial Block-face SEM and EDS

The combination of serial block-face scanning electron microscopy and energy dispersive x-ray spectroscopy (EDS) is demonstrated for 3D elemental analysis of materials, enabling investigations of large sample volumes compared to other tomographic techniques. The approach involves cutting a stack of 200 slices from an aluminum-copper alloy specimen and generating EDS maps after each cut. moreJul. 10, 2011

Analysis of Boron with Energy Dispersive X-ray Spectrometry

The analysis of light elements (from Be to F, refer to periodic table in fig. 1) presents a special challenge for energy dispersive X-ray spectrometry (EDS). Some of the problems are due to inherent physical effects, while others are technical in nature, relating to the design of the instrument used for analysis and the measurement procedure. Along with the demand for fast and efficient tools for analysis at the micro- and nanometer scale, the need for light element analysis with EDS has grown. moreMay. 13, 2011

Tensile Testing of Microstructures

The small size of micro- and nano-structures makes tensile testing challenging. In this study we meet this challenge by combined use of a Focussed Ion Beam (FIB) in Dual Beam configuration, an AFM-cantilever, and a micromanipulator which provide the required accuracy and versatility to measure the mechanical properties of nanowires by tensile testing. AFM cantilevers with a big range of force constants principally enable us to measure the tensile behavior of a great variety of materials. moreApr. 11, 2011

ESEM in Plant Sciences - Versatile Tool to Study Native & Hydrated Plant Surfaces

ESEM (Environmental Scanning Electron Microscopy) enables the investigation of native, hydrated and uncoated plant surfaces without further sample preparation and the in situ observation of dynamic processes at SEM resolution. A selection of representative plant samples and applications will be presented to show that ESEM is a versatile tool in plant science. more