Nov. 24, 2017Products
The TopoMAPS software for SEM image enhancement, 3D reconstruction and metrology from Digital Surf is now available on Thermo Scientific SEM and DualBeam systems.
Oct. 24, 2017Science
Focused Ion Beam / Scanning Electron Microscopy tomography is an unique method for the 3D description of different materials on the micro- and nanoscale. The application of this method to the microstructural study of gas and oil shales is ...
Sep. 20, 2017Science
Wear of friction materials symbolizes a challenge since several chemical compounds are being released. There is still a lack of information about chemical composition of friction layer and the wear debris. It is necessary to develop ...
Aug. 07, 2017Products
The WITec RISE microscopy mode for correlative Raman-SEM imaging is now compatible with Zeiss Sigma 300, a field emission scanning electron microscope (FE-SEM). With this jointly-developed hybrid system, WITec and Zeiss have furthered ...
Jan. 25, 2017Products
Bruker has introduced the e-Flash FS and e-Flash HD in a new generation of detectors for electron backscatter diffraction (EBSD) analysis on scanning electron microscopes (SEM).
Sep. 15, 2016Science
Serial block-face scanning electron microscopy (SBFSEM, SBEM) is a well established method in life sciences. The combination of ultramicrotomy and scanning electron microscopy enables imaging with high resolution and the reconstruction of ...
Sep. 02, 2016Products
Nanosystem announced the release of Nanomap Alpha software based on Digital Surf’s industry-standard Mountains software platform. The software is now integrated into the company’s NV- and NVM-series high precision 3D optical ...
Aug. 03, 2016Products
Tescan is a multi-national company and a leading global developer and supplier of scanning electron microscopes (SEMs), focused ion beam scanning electron microscope (FIB-SEM) systems, unique solutions for SEM and FIB-SEM ...
The CHIPSCANNER from Raith uniquely combines high-resolution electron optics, multiple, highly efficient electron detectors and most precise Laser interferometer Stage technology.
Building off of 50 years of SEM innovation is JEOL’s JSM-IT100 series SEM. Ease of use is a key feature of our InTouchScopeTM series while still maintaining the versatility and expandability expected from a research grade SEM.
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