Sep. 06, 2011

Sensofar-Tech Expands Management Team

Sensofar-Tech has appointed Gerald Nitsch as the Vice President of Sales and Marketing and Natxo Millan as Software Manager. moreMar. 10, 2010

Optical Micro- and Nano- Metrology

To image and measure small structures, forms and surface roughness has become more easy, fast and versatile with the Sensofar PLµ Neox, distributed by the Schaefer-Tec group. The optical profilometers of the PLµ series combine the two complementary measuring techniques of confocal microscopy and interferometry in one and the same instrument. With this, high resolution 3-D imaging and dimensional measurements of nearly all kinds of surfaces are obtained easily and fast. moreNov. 14, 2009

Confocal and Interferometer Profiler in one

Schaefer-Tec launched the new Sensofar PLµ NEOX optical profiler that combines the complementary measuring methods confocal and interferometry in one instrument. The integrated piezo scanner provides a vertical resolution of down to 0.01nm in the Phaseshifting Interferometry mode while the linear stage allows for up to 40 mm vertical scanrange. Sensofars patented microdisplay-based confocal scanning technology works without moving parts and guarantees a very long lifetime without maintenance. moreNov. 02, 2009

Combined Precision for Non-Contact ­Surface Metrology

In recent years, interferometers and confocal imaging profilers have been competing fiercely to conquer the non-contact surface metrology market. Today, Leica Microsystems and Sensofar present a new complete solution able to outperform all existing systems due to its unique combination of techniques. The DCM 3D is the first dual core 3D measuring microscope which combines both confocal and interferometry techniques on a single sensor head. more