Silicon Drift Detector
May. 04, 2011
FEI Company has announced that elemental mapping at the atomic-level is now possible across the periodic table using ChemiSTEM Technology.
The combination of increased current in an atomic-sized probe by Cs-correction and the increase in X-ray detection sensitivity and beam current of the ChemiSTEM Technology allows results to be obtained within minutes.
moreFeb. 21, 2011
Oxford Instruments has completed the installation of its 1000th X-Max:
X-Max was introduced to the market over two years ago and was the world's first "Large Area" silicon drift detector with an effective sensor area of 80mm2. The installation of the 1000th X-Max took place at Atotech in Berlin, Germany.
moreFeb. 02, 2011
EDAX released the Apollo Silicon Drift Detector (SDD) Series for the transmission electron microscope (TEM). The series includes the Apollo XLT with a Super Ultra Thin Window (SUTW) and the Apollo XLTW, a windowless version.
The windowless version further maximizes the collection efficiency and improves sensitivity up to 500% for low-energy X-rays. As a result, the mapping speed and light element detection in low concentrations are enhanced with the Apollo XLTW.
moreMar. 31, 2010
Organic and mineral samples, containing light elements like oxygen, nitrogen or beryllium have been analyzed using an attachable X-ray optic with an SDD in SEM. Compared to the measurements without the additional optic, there is a significant increase of the detection sensitivity for X-rays in the energy range below 1 keV. In contrast the spectrum above 1 keV is not affected. The optic can provide similar intensities for low and high energy X-ray lines even at high accelerating voltage.